Patents by Inventor Tatsuo Hariyama

Tatsuo Hariyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230194247
    Abstract: An object is to provide a technique capable of measuring a shape of an object while maintaining accuracy even when positional accuracy of a mechanism configured to move a probe is insufficient. A measurement control device 210 controls a movement mechanism 500 to move a measurement probe 160 to a target position of a target to be measured, calculates an error between an actual position of the measurement probe 160 detected by the measurement probe 160 and the target position, corrects the error by moving the measurement probe 160 by the movement mechanism 500 based on the calculated error, and then causes the measurement probe 160 to perform a distance measurement.
    Type: Application
    Filed: May 10, 2021
    Publication date: June 22, 2023
    Inventors: Masahiro WATANABE, Tatsuo HARIYAMA, Kenji MARUNO, Shinya HAMAGISHI, Motoki HARAYAMA
  • Patent number: 11644545
    Abstract: A distance measuring device includes a light emitting unit that outputs a measurement light, a first polarization state control unit that controls a polarization state of the measurement light output from the light emitting unit, a second polarization state control unit that controls the polarization state of the measurement light of which a polarization state is controlled by the first polarization state control unit, and an optical path switching element that selects an emission direction of the measurement light of which a polarization state is controlled by the second polarization state control unit, in which the second polarization state control unit controls the polarization state of the measurement light so that the measurement lights are emitted from the optical path switching element in a plurality of the emission directions, and the optical path switching element receives a reflected light obtained by reflecting the emitted measurement light by an object.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: May 9, 2023
    Assignee: HITACHI, LTD.
    Inventors: Kenji Maruno, Masahiro Watanabe, Yuta Urano, Tatsuo Hariyama, Atsushi Taniguchi
  • Patent number: 11635295
    Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.
    Type: Grant
    Filed: February 13, 2020
    Date of Patent: April 25, 2023
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno, Akio Yazaki
  • Publication number: 20220268929
    Abstract: According to the present invention, a measured distance is corrected in accordance with change in the surrounding environment.
    Type: Application
    Filed: June 11, 2020
    Publication date: August 25, 2022
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
  • Patent number: 11421976
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.
    Type: Grant
    Filed: June 3, 2021
    Date of Patent: August 23, 2022
    Assignee: HITACHI, LTD.
    Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno
  • Publication number: 20220178680
    Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.
    Type: Application
    Filed: February 13, 2020
    Publication date: June 9, 2022
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO, Akio YAZAKI
  • Publication number: 20210293524
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.
    Type: Application
    Filed: June 3, 2021
    Publication date: September 23, 2021
    Applicant: HITACHI, LTD.
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
  • Patent number: 11054242
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip unit, and a calculation unit. The probe tip unit includes an optical element that is configured to irradiate an object with measurement light, a fixing mechanism that is configured to fix to the measurement probe so as to be detachable and replaceable, and a cylindrical unit that is configured to lock the optical element and is provided with the fixing mechanism.
    Type: Grant
    Filed: November 25, 2019
    Date of Patent: July 6, 2021
    Assignee: HITACHI, LTD.
    Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno
  • Patent number: 10900773
    Abstract: An object is to provide a technology capable of realizing miniaturizing of a measurement unit in a distance measuring device. The distance measuring device including a light emitting unit that outputs measurement light, a polarization state control unit that controls polarization of the measurement light output from the light emitting unit, and an optical path switching element that selectively emits the measurement light controlled by the polarization state control unit, in which the polarization state control unit controls the polarization so as to emit the measurement light in a plurality of directions from the optical path switching element, and the optical path switching element receives reflected light with respect to an object of the measurement light emitted from the optical path switching element, the reflected light being used to measure a distance to the object.
    Type: Grant
    Filed: May 22, 2018
    Date of Patent: January 26, 2021
    Assignee: Hitachi, Ltd.
    Inventors: Masahiro Watanabe, Tatsuo Hariyama, Atsushi Taniguchi, Kenji Maruno
  • Publication number: 20200166327
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip unit, and a calculation unit. The probe tip unit includes an optical element that is configured to irradiate an object with measurement light, a fixing mechanism that is configured to fix to the measurement probe so as to be detachable and replaceable, and a cylindrical unit that is configured to lock the optical element and is provided with the fixing mechanism.
    Type: Application
    Filed: November 25, 2019
    Publication date: May 28, 2020
    Applicant: HITACHI, LTD.
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
  • Publication number: 20200041259
    Abstract: An object is to provide a technology capable of realizing miniaturizing of a measurement unit in a distance measuring device. The distance measuring device including a light emitting unit that outputs measurement light, a polarization state control unit that controls polarization of the measurement light output from the light emitting unit, and an optical path switching element that selectively emits the measurement light controlled by the polarization state control unit, in which the polarization state control unit controls the polarization so as to emit the measurement light in a plurality of directions from the optical path switching element, and the optical path switching element receives reflected light with respect to an object of the measurement light emitted from the optical path switching element, the reflected light being used to measure a distance to the object.
    Type: Application
    Filed: May 22, 2018
    Publication date: February 6, 2020
    Inventors: Masahiro WATANABE, Tatsuo HARIYAMA, Atsushi TANIGUCHI, Kenji MARUNO
  • Publication number: 20200018823
    Abstract: A distance measuring device includes a light emitting unit that outputs a measurement light, a first polarization state control unit that controls a polarization state of the measurement light output from the light emitting unit, a second polarization state control unit that controls the polarization state of the measurement light of which a polarization state is controlled by the first polarization state control unit, and an optical path switching element that selects an emission direction of the measurement light of which a polarization state is controlled by the second polarization state control unit, in which the second polarization state control unit controls the polarization state of the measurement light so that the measurement lights are emitted from the optical path switching element in a plurality of the emission directions, and the optical path switching element receives a reflected light obtained by reflecting the emitted measurement light by an object.
    Type: Application
    Filed: July 10, 2019
    Publication date: January 16, 2020
    Applicant: HITACHI, LTD.
    Inventors: Kenji MARUNO, Masahiro WATANABE, Yuta URANO, Tatsuo HARIYAMA, Atsushi TANIGUCHI
  • Patent number: 10436572
    Abstract: An object of the present invention is to provide a compact and highly-accurate three-dimensional shape measurement apparatus. The three-dimensional shape measurement apparatus according to the present invention causes a part of a measurement light to proceed in a direction which is different from a direction with respect to a subject as an angle measurement light, and detects a rotation angle using the angle measurement light.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: October 8, 2019
    Assignee: Hitachi, Ltd.
    Inventors: Masahiro Watanabe, Tatsuo Hariyama, Masayuki Kobayashi
  • Publication number: 20190011249
    Abstract: An object of the present invention is to provide a compact and highly-accurate three-dimensional shape measurement apparatus. The three-dimensional shape measurement apparatus according to the present invention causes a part of a measurement light to proceed in a direction which is different from a direction with respect to a subject as an angle measurement light, and detects a rotation angle using the angle measurement light.
    Type: Application
    Filed: March 30, 2016
    Publication date: January 10, 2019
    Inventors: Masahiro WATANABE, Tatsuo HARIYAMA, Masayuki KOBAYASHI
  • Publication number: 20180224548
    Abstract: The present disclosure discloses a distance measuring apparatus that enables measuring a distance of a target object with high accuracy. The distance measuring apparatus includes a light source unit that emits a plurality of light beams having different wavelengths, an irradiation optical element that irradiates a measurement target with the emitted light beams, a light receiving unit that receives the light reflected by the measurement target, and a processor that calculates the distance from the light source to the measurement target from the signal detected by the light receiving element. Then, the processor executes frequency calculation processing of calculating a peak frequency corresponding to each wavelength from the signal detected by the light receiving unit and distance calculation processing of reducing the Doppler shift errors caused by the oscillation of the measurement target from the peak frequency corresponding to each wavelength to calculate the distance.
    Type: Application
    Filed: April 26, 2016
    Publication date: August 9, 2018
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE
  • Patent number: 9733066
    Abstract: The purpose of the present invention is to provide a shape measuring device and method, wherein the separation of light from one distance sensor increases measurement precision without increasing the size of the device. The present invention provides “a shape measuring device comprising: a distance sensor that radiates a laser toward a measurement target and detects the reflected light so as to calculate the distance to a measurement point; a separation unit that separates the light from the distance sensor into a plurality of light rays; a rotation unit that rotates the distance sensor and the measurement target relative to each other; and a data processing unit that integrates measurement results obtained from the distance sensor for the distances to a plurality of measurement points.
    Type: Grant
    Filed: April 28, 2014
    Date of Patent: August 15, 2017
    Assignee: Hitachi, Ltd.
    Inventors: Hiroaki Kasai, Tatsuo Hariyama, Masahiro Watanabe
  • Patent number: 9541380
    Abstract: The purpose of the present invention is to provide a shape inspection device that improves, without making the device larger, durability and measurement precision by measuring a plurality of points with a single distance sensor. The present invention provides a shape measuring device that measures the shape of an object to be measured and that comprises: a distance sensor that calculates the distance to the object to be measure by irradiating a measurement light toward the object to be measured and detecting the reflected light from the object to be measured; a separating unit that separates the measurement light from the distance sensor into a plurality of measurement light rays to be irradiated onto a plurality of measuring points; and a selecting unit that selects, from the plurality of measurement light beams separated by the separating unit, the measurement light to irradiate the object to be measured.
    Type: Grant
    Filed: October 2, 2013
    Date of Patent: January 10, 2017
    Assignee: Hitachi, Ltd.
    Inventors: Hiroaki Kasai, Tatsuo Hariyama, Masahiro Watanabe
  • Publication number: 20160131473
    Abstract: The purpose of the present invention is to provide a shape measuring device and method, wherein the separation of light from one distance sensor increases measurement precision without increasing the size of the device. The present invention provides “a shape measuring device comprising: a distance sensor that radiates a laser toward a measurement target and detects the reflected light so as to calculate the distance to a measurement point; a separation unit that separates the light from the distance sensor into a plurality of light rays; a rotation unit that rotates the distance sensor and the measurement target relative to each other; and a data processing unit that integrates measurement results obtained from the distance sensor for the distances to a plurality of measurement points.
    Type: Application
    Filed: April 28, 2014
    Publication date: May 12, 2016
    Inventors: Hiroaki KASAI, Tatsuo HARIYAMA, Masahiro WATANABE
  • Publication number: 20150241206
    Abstract: The purpose of the present invention is to provide a shape inspection device that improves, without making the device larger, durability and measurement precision by measuring a plurality of points with a single distance sensor. The present invention provides a shape measuring device that measures the shape of an object to be measured and that comprises: a distance sensor that calculates the distance to the object to be measure by irradiating a measurement light toward the object to be measured and detecting the reflected light from the object to be measured; a separating unit that separates the measurement light from the distance sensor into a plurality of measurement light rays to be irradiated onto a plurality of measuring points; and a selecting unit that selects, from the plurality of measurement light beams separated by the separating unit, the measurement light to irradiate the object to be measured.
    Type: Application
    Filed: October 2, 2013
    Publication date: August 27, 2015
    Inventors: Hiroaki Kasai, Tatsuo Hariyama, Masahiro Watanabe
  • Patent number: 9062965
    Abstract: A multi-point measuring apparatus of FBG sensor has an optical fiber, a wide-band wavelength light source, a light-source side light modulator for controlling time of a light entering into the optical fiber, among lights from this light source, a detector side light modulator for controlling time, during which a reflection light from a diffraction grating of the optical fiber penetrates through, a wavelength shift amount calculator for processing a signal obtained through detection of the reflection light from this light modulator, a temperature/distortion calculator for calculating an amount of deformation of a target to be measured from a result of this calculator, and a display portion for displaying information relating to the amount of deformation of this target to be measured.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: June 23, 2015
    Assignee: Hitachi, Ltd.
    Inventors: Minoru Yoshida, Masahiro Watanabe, Tatsuo Hariyama