Patents by Inventor Tatsuo Igushi

Tatsuo Igushi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11428616
    Abstract: The present claimed invention is to facilitate cleaning work of a cell for a particle size distribution measuring device that measures a particle size distribution by means of a line start method, and comprises a cell 2 that houses a density gradient solution, a cell rotating mechanism 3 that rotates the cell 2 so that a centrifugal force is applied to the cell 2 from a smaller density gradient to a larger density gradient and a sample introducing mechanism 7 that introduces a measurement sample into the cell 2 that is rotated by the cell rotating mechanism 3, and is so configured that the cell 2 is detachable from a main body of the device.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: August 30, 2022
    Assignee: HORIBA, LTD.
    Inventors: Tetsuji Yamaguchi, Takeshi Akamatsu, Tatsuo Igushi
  • Publication number: 20210310925
    Abstract: The present claimed invention is to facilitate cleaning work of a cell for a particle size distribution measuring device that measures a particle size distribution by means of a line start method, and comprises a cell 2 that houses a density gradient solution, a cell rotating mechanism 3 that rotates the cell 2 so that a centrifugal force is applied to the cell 2 from a smaller density gradient to a larger density gradient and a sample introducing mechanism 7 that introduces a measurement sample into the cell 2 that is rotated by the cell rotating mechanism 3, and is so configured that the cell 2 is detachable from a main body of the device.
    Type: Application
    Filed: October 29, 2019
    Publication date: October 7, 2021
    Inventors: Tetsuji YAMAGUCHI, Takeshi AKAMATSU, Tatsuo IGUSHI
  • Publication number: 20200080935
    Abstract: A method and a sample analysis apparatus having a processing part for practicing the method, the method including a step of, with respect to an immunoagglutination reaction that occurred in the reaction solution between the test substance and a binding partner thereof, determining an index value relating to a difference between a changing speed of a scattered light intensity in a first period of the reaction and a changing speed of a scattered light intensity in a second period of the reaction, based on a scattered light intensity of the reaction solution in the first period and a scattered light intensity of the reaction solution in the second period, and a step of determining whether the concentration of the test substance is within a proper range by comparing the index value and a predetermined threshold value.
    Type: Application
    Filed: September 12, 2017
    Publication date: March 12, 2020
    Inventors: Tatsuo Igushi, Takuto Maeda
  • Patent number: 10254213
    Abstract: A particle analysis apparatus for flow cytometry, which contains a flow cell having a flow channel for flowing a sample solution containing particles to be analyzed, a light source device for emitting an irradiation light, an optical system for irradiating the irradiation light on an irradiation segment in the flow channel, and a light receiving device for detecting the light obtained thereby. A light source of the light source device is LED, and an electrode formed on a light extraction surface thereof mainly contains a plurality of electric conductor lines arranged in parallel to each other.
    Type: Grant
    Filed: July 15, 2015
    Date of Patent: April 9, 2019
    Assignee: HORIBA, LTD.
    Inventors: Motoaki Hamada, Tatsuo Igushi
  • Publication number: 20160018314
    Abstract: A particle analysis apparatus for flow cytometry, which contains a flow cell having a flow channel for flowing a sample solution containing particles to be analyzed, a light source device for emitting an irradiation light, an optical system for irradiating the irradiation light on an irradiation segment in the flow channel, and a light receiving device for detecting the light obtained thereby. A light source of the light source device is LED, and an electrode formed on a light extraction surface thereof mainly contains a plurality of electric conductor lines arranged in parallel to each other.
    Type: Application
    Filed: July 15, 2015
    Publication date: January 21, 2016
    Inventors: Motoaki Hamada, Tatsuo Igushi
  • Patent number: 8625093
    Abstract: Provided is a particle characterization device that can ensure measurement accuracy even though light detecting means has a single configuration, and enables the number of optical elements to be decreased as much as possible to suppress cost increase and reduce the number of adjustment places, and the particle characterization device has an incident side polarizer and an incident side ¼ wavelength plate as an illumination optical system mechanism and, as a light receiving optical system mechanism, an exit side ¼ wavelength plate and an exit side polarizer that can be rotated to a plurality of angle positions around a cell, wherein light attenuating means that prevents a polarization state from being changed is provided on a light path, and a light attenuation rate by the light attenuating means is controlled such that a detected light intensity at each measurement position falls within a measurement range of light detecting means.
    Type: Grant
    Filed: September 25, 2009
    Date of Patent: January 7, 2014
    Assignee: Horiba, Ltd.
    Inventors: Tetsuji Yamaguchi, Tatsuo Igushi, Takuji Kurozumi
  • Publication number: 20110181869
    Abstract: Provided is a particle characterization device that can ensure measurement accuracy even though light detecting means has a single configuration, and enables the number of optical elements to be decreased as much as possible to suppress cost increase and reduce the number of adjustment places, and the particle characterization device has an incident side polarizer and an incident side ¼ wavelength plate as an illumination optical system mechanism and, as a light receiving optical system mechanism, an exit side ¼ wavelength plate and an exit side polarizer that can be rotated to a plurality of angle positions around a cell, wherein light attenuating means that prevents a polarization state from being changed is provided on a light path, and a light attenuation rate by the light attenuating means is controlled such that a detected light intensity at each measurement position falls within a measurement range of light detecting means.
    Type: Application
    Filed: September 25, 2009
    Publication date: July 28, 2011
    Applicant: HORIBA, LTD.
    Inventors: Tetsuji Yamaguchi, Tatsuo Igushi, Takuji Kurozumi
  • Patent number: 7483027
    Abstract: An analyzer according to this invention is configured to retrieve an analysis data file quickly.
    Type: Grant
    Filed: August 17, 2005
    Date of Patent: January 27, 2009
    Assignee: Horiba, Ltd.
    Inventors: Seiichiro Yoshioka, Yoshiyuki Okada, Tatsuo Igushi, Loic Merckel
  • Publication number: 20060055697
    Abstract: An analyzer according to this invention is configured to retrieve an analysis data file quickly.
    Type: Application
    Filed: August 17, 2005
    Publication date: March 16, 2006
    Inventors: Seiichiro Yoshioka, Yoshiyuki Okada, Tatsuo Igushi, Loic Merckel
  • Patent number: 6252658
    Abstract: A particle size distribution measuring apparatus includes a source of laser light for providing a laser beam to a sample cell that can hold a sample to be measured. A condenser lens converges the laser beam towards the sample cell along an optical axis. The position on the other side of the sample cell is a ring detector unit that can be aligned with the optical axis to measure light intensity at relatively small scattering angles from contact with particles in the sample cell. An array of detectors can be operatively positioned on a substrate with appropriate amplifying multiplying and analog to digital conversion capacity for measuring light intensity at relatively large scatter angles. The outputs of the ring detector unit and the array of detectors can be used to determine the particle size distribution of particles in the sample.
    Type: Grant
    Filed: October 8, 1999
    Date of Patent: June 26, 2001
    Assignee: Horiba, Ltd.
    Inventors: Yoshiaki Togawa, Tatsuo Igushi, Toshiya Ito, Yukio Sakai
  • Patent number: 6236458
    Abstract: A particle distribution size measuring apparatus incorporates a detector array having a plurality of light detecting elements located on a substrate. A first group of detector elements have a plurality of sectors with a common sector angle, while at least one other detector element is positioned furthest from an optical axis and has a smaller sector angle. Each of the detector elements can be formed on a single substrate and their position and alignment have increased the efficiency of manufacturing the arrays.
    Type: Grant
    Filed: November 19, 1999
    Date of Patent: May 22, 2001
    Assignee: Horiba, Ltd.
    Inventors: Tatsuo Igushi, Yoshiaki Togawa
  • Patent number: 6191853
    Abstract: An apparatus and method for measuring a particle size distribution comprising a light source directing a laser light to particles which are dispersed into a solvent and which exhibit Brownian motion, a detector converting an interference light caused by Doppler-shifted scattered light by the particles into an electric detection signal, an operation unit obtaining an intermediate function by processing the detection signal, and a processing unit subjecting the intermediate function to an inverse problem and thereby calculating a particle size distribution. The apparatus includes a data selecting unit between the operation unit and the processing unit for selecting data from all data regions in the intermediate function at appropriate intervals and creating a data table used in an inverse problem.
    Type: Grant
    Filed: September 28, 1999
    Date of Patent: February 20, 2001
    Assignee: Horiba, Ltd.
    Inventors: Tetsuji Yamaguchi, Tatsuo Igushi
  • Patent number: 6061131
    Abstract: A light scattering particle size distribution measuring apparatus inches a light source for providing a beam of light to contact with a sample cell holding a specimen. A detector assembly includes a first set of detector assembly includes a first set of detector elements for receiving scattered and/or diffracted light from the sample cell and a second set of detector elements positioned between the first set of detector elements. A removable scattering and/or diffracting target member can be positioned on the optical axis to provide a predetermined scattered and/or diffraction pattern to the detector assembly whereby the second set of detector elements can measure the predetermined fraction pattern to enable a movement of one of the light source and the detector assembly to align them on an optical axis.
    Type: Grant
    Filed: January 8, 1997
    Date of Patent: May 9, 2000
    Assignee: Horiba, Ltd.
    Inventors: Tatsuo Igushi, Yoshiaki Togawa
  • Patent number: 5936729
    Abstract: An improved photo detector assembly for a particle size distribution measuring equipment provides a unitary opaque coating deposited above a photo detector layer with a plurality of concentric apertures that can be defined with high precision about a concentric center. The masking can be applied in a production environment to ensure high accuracy and a compact size.
    Type: Grant
    Filed: March 25, 1997
    Date of Patent: August 10, 1999
    Assignee: Horiba, Ltd.
    Inventor: Tatsuo Igushi
  • Patent number: 5796480
    Abstract: Particle size distribution measuring equipment includes a flow cell that can be illuminated with light so that suspended particles can scatter the light and thereby measure both particle size and frequency. A dispenser unit is connected to the flow cell for delivering a sample. A fractionator unit can pretreat the sample to provide particles over a predetermined size in a sealed chamber resulting from the impact of compressed air. The fractionated sample can be delivered to the dispenser, and a controller can automatically coordinate the preparation of the dispenser unit, the flow cell, the measuring of scattered light, and the release of the fractionated sample from the sealed chamber.
    Type: Grant
    Filed: November 22, 1996
    Date of Patent: August 18, 1998
    Assignee: Horiba, Ltd.
    Inventor: Tatsuo Igushi
  • Patent number: 5682235
    Abstract: A dry particle-size distribution measuring apparatus capable of conducting a measurement using a small quantity of sample. An optical system, a sample detector, a controller, an operating portion, and a sample-supplying portion which intermittently supplies a sample are provided. The optical system has a laser beam source emitting a laser beam, a collecting lens, and a detector which detects scattered or transmitted light. The sample supply-detecting means has a light transmitter and a light receiver provided between the sample-supplying portion and the optical system. The controlling and operating portion has a CPU which receives a detected signal from the detector and measures the particle-size distribution on the basis of the scattered or transmitted light data from the sample.
    Type: Grant
    Filed: August 31, 1995
    Date of Patent: October 28, 1997
    Assignee: Horiba, Ltd.
    Inventor: Tatsuo Igushi
  • Patent number: 5212393
    Abstract: A sample cell for use in measuring the particle size distribution of samples using diffraction-scattering measurement methods has a radiating surface which is beveled to increase the angle of incidence of scattered light which is scattered at a large scattering angle such that it is transmitted through the radiating surface of the sample cell and thereby allowed to impinge upon a detector.
    Type: Grant
    Filed: August 6, 1992
    Date of Patent: May 18, 1993
    Assignee: Horiba, Ltd.
    Inventors: Yoshiaki Togawa, Tatsuo Igushi, Koichiro Matsuda
  • Patent number: 5185641
    Abstract: An apparatus for measuring a wide range of particle sizes in of a sample fluid with two separate light sources is provided. The individual light sources can be compensated to take into account any variations in transmission factors through the sample fluid prior to calculating the particle size distribution. Additionally, any fluctuations in the light source can also be measured to provide a compensation factor for the measured light intensities.
    Type: Grant
    Filed: November 1, 1991
    Date of Patent: February 9, 1993
    Assignee: Horiba, Ltd.
    Inventors: Tatsuo Igushi, Yoshiaki Togawa
  • Patent number: 5164787
    Abstract: A particular size measuring apparatus uses laser light and monochrome beams of different wavelengths to measure a wide range of particle sizes. The monochrome beams are obtained from a lamp source and are changed in wavelength by a group of band-pass filters, whereby different ranges of particle sizes can be measured for the respective single wavelengths and thus the range of particle sizes capable of being measured can be expanded.
    Type: Grant
    Filed: November 1, 1991
    Date of Patent: November 17, 1992
    Assignee: Horiba, Ltd.
    Inventors: Tatsuo Igushi, Yoshiaki Togawa