Patents by Inventor Tatsuo Osaka

Tatsuo Osaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220187479
    Abstract: According to an embodiment, a radiation detector includes scintillator elements, dielectric multilayer films, and a metal reflective layer. The scintillator elements are arranged in a two-dimensional grid pattern. The dielectric multilayer films are provided between adjacent scintillator elements such that a dielectric multilayer film is adjacent to one of said scintillator elements. The metal reflective layer is provided between adjacent dielectric multilayer films.
    Type: Application
    Filed: December 13, 2021
    Publication date: June 16, 2022
    Applicant: CANON MEDICAL SYSTEMS CORPORATION
    Inventors: Yusuke TERAO, Tatsuo OSAKA, Akihiko TANIGUCHI
  • Publication number: 20220146695
    Abstract: A radiation detector according to an embodiment includes a scintillator array, a sensor array, electronic circuitry, a switch, and control circuitry. The scintillator array includes a plurality of scintillator pixels each configured to convert radiation into light. The sensor array includes a plurality of detection elements each configured to detect the light. The electronic circuitry is configured to output digital data on the basis of signals output from the detection elements. The switch is provided between the sensor array and the electronic circuitry. The control circuitry is configured to control the switch on the basis of a positional relation between the sensor array and the scintillator array.
    Type: Application
    Filed: November 9, 2021
    Publication date: May 12, 2022
    Applicant: CANON MEDICAL SYSTEMS CORPORATION
    Inventors: Go KAWATA, Tatsuo OSAKA
  • Patent number: 7486403
    Abstract: In order to accurately measure a shape feature of a minute droplet arranged on a substrate by a simple method, with respect to the droplet, the substrate is perpendicularly irradiated with laser light to cause diffracted light fluxes generated during passage of the laser light through the droplet to interfere with each other, so that a diffraction pattern is obtained. The diffraction pattern formed on a screen of a detector as an image is picked up by an image pickup apparatus. The shape feature of the droplet is measured by using the resultant diffraction pattern and a refractive index of the droplet.
    Type: Grant
    Filed: July 18, 2007
    Date of Patent: February 3, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Tatsuo Osaka, Yoshikatsu Okada, Shigeru Yamada, Keiji Sakai
  • Publication number: 20080018909
    Abstract: In order to accurately measure a shape feature of a minute droplet arranged on a substrate by a simple method, with respect to the droplet, the substrate is perpendicularly irradiated with laser light to cause diffracted light fluxes generated during passage of the laser light through the droplet to interfere with each other, so that a diffraction pattern is obtained. The diffraction pattern formed on a screen of a detector as an image is picked up by an image pickup apparatus. The shape feature of the droplet is measured by using the resultant diffraction pattern and a refractive index of the droplet.
    Type: Application
    Filed: July 18, 2007
    Publication date: January 24, 2008
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Tatsuo Osaka, Yoshikatsu Okada, Shigeru Yamada, Keiji Sakai