Patents by Inventor Tatsuo Urushidani

Tatsuo Urushidani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10486422
    Abstract: A printer having a printhead configured to print to a print medium; a camera configured to photograph the print medium; a carriage configured to support and move the printhead and the camera; and a processor configured to print, by the printhead, on the print medium a first test pattern that is larger than an imaging area of the camera, photograph the first test pattern by the camera, and detect a printing defect based on a result of the photograph.
    Type: Grant
    Filed: April 12, 2018
    Date of Patent: November 26, 2019
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Tatsuo Urushidani
  • Publication number: 20180297359
    Abstract: A printer having a printhead configured to print to a print medium; a camera configured to photograph the print medium; a carriage configured to support and move the printhead and the camera; and a processor configured to print, by the printhead, on the print medium a first test pattern that is larger than an imaging area of the camera, photograph the first test pattern by the camera, and detect a printing defect based on a result of the photograph.
    Type: Application
    Filed: April 12, 2018
    Publication date: October 18, 2018
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Tatsuo URUSHIDANI
  • Patent number: 10015367
    Abstract: A printer includes a calibration reference object, which includes a calibration surface for performing calibration of a color measurement machine that performs color measurement of media, and a pressing force plate that determines a relative position of a media surface of the media and the calibration surface so that the media surface of the media and the calibration surface have a predetermined positional relationship.
    Type: Grant
    Filed: September 8, 2016
    Date of Patent: July 3, 2018
    Assignee: Seiko Epson Corporation
    Inventor: Tatsuo Urushidani
  • Patent number: 9995862
    Abstract: An optical filter includes: a first variable wavelength bandpass filter that can extract light of a first wavelength band (400 to 460 nm), the first wavelength band having a first spectral band having a central wavelength equal to a first wavelength in the first wavelength band and a second spectral band having a central wavelength equal to a second wavelength in the first wavelength band; and a second variable wavelength bandpass filter that can extract light of a second wavelength band (480 to 540 nm) adjacent to the first wavelength band, the second wavelength band having a third spectral band having a central wavelength equal to a third wavelength in the second wavelength band and a fourth spectral band having a central wavelength equal to a fourth wavelength in the second wavelength band.
    Type: Grant
    Filed: September 9, 2015
    Date of Patent: June 12, 2018
    Assignee: Seiko Epson Corporation
    Inventors: Tomonori Matsushita, Tatsuo Urushidani
  • Publication number: 20170078531
    Abstract: A printer includes a calibration reference object, which includes a calibration surface for performing calibration of a color measurement machine that performs color measurement of media, and a pressing force plate that determines a relative position of a media surface of the media and the calibration surface so that the media surface of the media and the calibration surface have a predetermined positional relationship.
    Type: Application
    Filed: September 8, 2016
    Publication date: March 16, 2017
    Inventor: Tatsuo URUSHIDANI
  • Patent number: 9404803
    Abstract: A light measurement device comprising an optical sensor that includes a tunable interference filter and a detecting section detecting light passed through the tunable filter, a storing section that stores a first correlation data and a second correlation data, and a CPU that obtains amount of the light by controlling the optical sensor based on the first correlation data and a second correlation data.
    Type: Grant
    Filed: September 12, 2014
    Date of Patent: August 2, 2016
    Assignee: Seiko Epson Corporation
    Inventor: Tatsuo Urushidani
  • Publication number: 20160077260
    Abstract: An interference filter includes a fixed mirror and a movable mirror which are disposed so as to face each other with a gap therebetween. The fixed mirror is formed by laminating a one-layer TiO2 film and a one-layer Ag alloy film. In addition, the movable mirror is formed by laminating a one-layer TiO2 film and a one-layer Ag alloy film.
    Type: Application
    Filed: November 25, 2015
    Publication date: March 17, 2016
    Inventor: Tatsuo URUSHIDANI
  • Publication number: 20160003993
    Abstract: An optical filter includes: a first variable wavelength bandpass filter that can extract light of a first wavelength band (400 to 460 nm), the first wavelength band having a first spectral band having a central wavelength equal to a first wavelength in the first wavelength band and a second spectral band having a central wavelength equal to a second wavelength in the first wavelength band; and a second variable wavelength bandpass filter that can extract light of a second wavelength band (480 to 540 nm) adjacent to the first wavelength band, the second wavelength band having a third spectral band having a central wavelength equal to a third wavelength in the second wavelength band and a fourth spectral band having a central wavelength equal to a fourth wavelength in the second wavelength band.
    Type: Application
    Filed: September 9, 2015
    Publication date: January 7, 2016
    Inventors: Tomonori MATSUSHITA, Tatsuo URUSHIDANI
  • Patent number: 9229219
    Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength ?1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength ?2 different from the first wavelength as a center wavelength.
    Type: Grant
    Filed: July 8, 2014
    Date of Patent: January 5, 2016
    Assignee: Seiko Epson Corporation
    Inventors: Tomonori Matsushita, Tatsuo Urushidani
  • Patent number: 8988683
    Abstract: A food analysis device includes a variable wavelength interference filter adapted to disperse light reflected by the food into a plurality of lights with respective wavelengths, an imaging section adapted to image the lights with the respective wavelengths obtained by the dispersion to obtain spectral images corresponding respectively to the wavelengths, and a control section adapted to obtain spectrum of each of the pixels from the spectral images corresponding to the respective wavelengths, and then detect a pixel including the absorption spectrum of water, and then detect a plurality of components based on the spectrum of the pixel detected.
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: March 24, 2015
    Assignee: Seiko Epson Corportion
    Inventor: Tatsuo Urushidani
  • Publication number: 20140375996
    Abstract: A light measurement device comprising an optical sensor that includes a tunable interference filter and a detecting section detecting light passed through the tunable filter, a storing section that stores a first correlation data and a second correlation data, and a CPU that obtains amount of the light by controlling the optical sensor based on the first correlation data and a second correlation data.
    Type: Application
    Filed: September 12, 2014
    Publication date: December 25, 2014
    Inventor: Tatsuo URUSHIDANI
  • Publication number: 20140320854
    Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength ?1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength ?2 different from the first wavelength as a center wavelength.
    Type: Application
    Filed: July 8, 2014
    Publication date: October 30, 2014
    Inventors: Tomonori MATSUSHITA, Tatsuo URUSHIDANI
  • Patent number: 8860950
    Abstract: A light measurement device comprising an optical sensor that includes a tunable interference filter and a detecting section detecting light passed through the tunable filter, a storing section that stores a first correlation data and a second correlation data, and a CPU that obtains amount of the light by controlling the optical sensor based on the first correlation data and a second correlation data.
    Type: Grant
    Filed: September 28, 2011
    Date of Patent: October 14, 2014
    Assignee: Seiko Epson Corporation
    Inventor: Tatsuo Urushidani
  • Patent number: 8817267
    Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength ?1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength ?2 different from the first wavelength as a center wavelength.
    Type: Grant
    Filed: August 17, 2011
    Date of Patent: August 26, 2014
    Assignee: Seiko Epson Corporation
    Inventors: Tomonori Matsushita, Tatsuo Urushidani
  • Publication number: 20140185046
    Abstract: A food analysis device includes a variable wavelength interference filter adapted to disperse light reflected by the food into a plurality of lights with respective wavelengths, an imaging section adapted to image the lights with the respective wavelengths obtained by the dispersion to obtain spectral images corresponding respectively to the wavelengths, and a control section adapted to obtain spectrum of each of the pixels from the spectral images corresponding to the respective wavelengths, and then detect a pixel including the absorption spectrum of water, and then detect a plurality of components based on the spectrum of the pixel detected.
    Type: Application
    Filed: December 23, 2013
    Publication date: July 3, 2014
    Applicant: Seiko Epson Corporation
    Inventor: Tatsuo URUSHIDANI
  • Publication number: 20120212823
    Abstract: An etalon as a tunable interference filter includes a first substrate, a second substrate, a fixed mirror, a movable mirror, and an electrostatic actuator. The respective mirrors are formed by stacking one layer of a TiO2 film and one layer of an alloy film. A film thickness dimension of the TiO2 film and a film thickness dimension of the Ag alloy film are set to film thicknesses such that reflectance of a reference wavelength may be target reflectance and reflectance of a set wavelength may be lower than that of the case where the reflection film is formed only by the metal film.
    Type: Application
    Filed: February 16, 2012
    Publication date: August 23, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Tatsuaki FUNAMOTO, Tatsuo URUSHIDANI
  • Publication number: 20120127471
    Abstract: An interference filter includes a fixed mirror and a movable mirror which are disposed so as to face each other with a gap therebetween. The fixed mirror is formed by laminating a one-layer TiO2 film and a one-layer Ag alloy film. In addition, the movable mirror is formed by laminating a one-layer TiO2 film and a one-layer Ag alloy film.
    Type: Application
    Filed: September 30, 2011
    Publication date: May 24, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Tatsuo URUSHIDANI
  • Publication number: 20120109584
    Abstract: A light measurement device comprising an optical sensor that includes a tunable interference filter and a detecting section detecting light passed through the tunable filter, a storing section that stores a first correlation data and a second correlation data, and a CPU that obtains amount of the light by controlling the optical sensor based on the first correlation data and a second correlation data.
    Type: Application
    Filed: September 28, 2011
    Publication date: May 3, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Tatsuo URUSHIDANI
  • Publication number: 20120044491
    Abstract: An optical filter includes a first substrate, a second substrate facing the first substrate, a first optical film provided to the first substrate, and a second optical film provided to the second substrate and facing the first optical film, and at least one of the first optical film and the second optical film has a metal film having a reflecting property and transmissibility of a light in a desired wavelength band, and a surface and an edge portion of the metal film is covered by a dielectric film. It is also possible to provide a tilted surface to an edge portion of the metal film. Further, it is also possible to form a step-like bump between the metal film and a dielectric film as another optical film formed under the metal film.
    Type: Application
    Filed: August 15, 2011
    Publication date: February 23, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Tatsuo URUSHIDANI, Yasushi MATSUNO
  • Publication number: 20120044492
    Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength ?1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength ?2 different from the first wavelength as a center wavelength.
    Type: Application
    Filed: August 17, 2011
    Publication date: February 23, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Tomonori MATSUSHITA, Tatsuo URUSHIDANI