Patents by Inventor Tatsuo Urushidani
Tatsuo Urushidani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10486422Abstract: A printer having a printhead configured to print to a print medium; a camera configured to photograph the print medium; a carriage configured to support and move the printhead and the camera; and a processor configured to print, by the printhead, on the print medium a first test pattern that is larger than an imaging area of the camera, photograph the first test pattern by the camera, and detect a printing defect based on a result of the photograph.Type: GrantFiled: April 12, 2018Date of Patent: November 26, 2019Assignee: SEIKO EPSON CORPORATIONInventor: Tatsuo Urushidani
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Publication number: 20180297359Abstract: A printer having a printhead configured to print to a print medium; a camera configured to photograph the print medium; a carriage configured to support and move the printhead and the camera; and a processor configured to print, by the printhead, on the print medium a first test pattern that is larger than an imaging area of the camera, photograph the first test pattern by the camera, and detect a printing defect based on a result of the photograph.Type: ApplicationFiled: April 12, 2018Publication date: October 18, 2018Applicant: SEIKO EPSON CORPORATIONInventor: Tatsuo URUSHIDANI
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Patent number: 10015367Abstract: A printer includes a calibration reference object, which includes a calibration surface for performing calibration of a color measurement machine that performs color measurement of media, and a pressing force plate that determines a relative position of a media surface of the media and the calibration surface so that the media surface of the media and the calibration surface have a predetermined positional relationship.Type: GrantFiled: September 8, 2016Date of Patent: July 3, 2018Assignee: Seiko Epson CorporationInventor: Tatsuo Urushidani
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Patent number: 9995862Abstract: An optical filter includes: a first variable wavelength bandpass filter that can extract light of a first wavelength band (400 to 460 nm), the first wavelength band having a first spectral band having a central wavelength equal to a first wavelength in the first wavelength band and a second spectral band having a central wavelength equal to a second wavelength in the first wavelength band; and a second variable wavelength bandpass filter that can extract light of a second wavelength band (480 to 540 nm) adjacent to the first wavelength band, the second wavelength band having a third spectral band having a central wavelength equal to a third wavelength in the second wavelength band and a fourth spectral band having a central wavelength equal to a fourth wavelength in the second wavelength band.Type: GrantFiled: September 9, 2015Date of Patent: June 12, 2018Assignee: Seiko Epson CorporationInventors: Tomonori Matsushita, Tatsuo Urushidani
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Publication number: 20170078531Abstract: A printer includes a calibration reference object, which includes a calibration surface for performing calibration of a color measurement machine that performs color measurement of media, and a pressing force plate that determines a relative position of a media surface of the media and the calibration surface so that the media surface of the media and the calibration surface have a predetermined positional relationship.Type: ApplicationFiled: September 8, 2016Publication date: March 16, 2017Inventor: Tatsuo URUSHIDANI
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Patent number: 9404803Abstract: A light measurement device comprising an optical sensor that includes a tunable interference filter and a detecting section detecting light passed through the tunable filter, a storing section that stores a first correlation data and a second correlation data, and a CPU that obtains amount of the light by controlling the optical sensor based on the first correlation data and a second correlation data.Type: GrantFiled: September 12, 2014Date of Patent: August 2, 2016Assignee: Seiko Epson CorporationInventor: Tatsuo Urushidani
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Publication number: 20160077260Abstract: An interference filter includes a fixed mirror and a movable mirror which are disposed so as to face each other with a gap therebetween. The fixed mirror is formed by laminating a one-layer TiO2 film and a one-layer Ag alloy film. In addition, the movable mirror is formed by laminating a one-layer TiO2 film and a one-layer Ag alloy film.Type: ApplicationFiled: November 25, 2015Publication date: March 17, 2016Inventor: Tatsuo URUSHIDANI
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Publication number: 20160003993Abstract: An optical filter includes: a first variable wavelength bandpass filter that can extract light of a first wavelength band (400 to 460 nm), the first wavelength band having a first spectral band having a central wavelength equal to a first wavelength in the first wavelength band and a second spectral band having a central wavelength equal to a second wavelength in the first wavelength band; and a second variable wavelength bandpass filter that can extract light of a second wavelength band (480 to 540 nm) adjacent to the first wavelength band, the second wavelength band having a third spectral band having a central wavelength equal to a third wavelength in the second wavelength band and a fourth spectral band having a central wavelength equal to a fourth wavelength in the second wavelength band.Type: ApplicationFiled: September 9, 2015Publication date: January 7, 2016Inventors: Tomonori MATSUSHITA, Tatsuo URUSHIDANI
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Patent number: 9229219Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength ?1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength ?2 different from the first wavelength as a center wavelength.Type: GrantFiled: July 8, 2014Date of Patent: January 5, 2016Assignee: Seiko Epson CorporationInventors: Tomonori Matsushita, Tatsuo Urushidani
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Patent number: 8988683Abstract: A food analysis device includes a variable wavelength interference filter adapted to disperse light reflected by the food into a plurality of lights with respective wavelengths, an imaging section adapted to image the lights with the respective wavelengths obtained by the dispersion to obtain spectral images corresponding respectively to the wavelengths, and a control section adapted to obtain spectrum of each of the pixels from the spectral images corresponding to the respective wavelengths, and then detect a pixel including the absorption spectrum of water, and then detect a plurality of components based on the spectrum of the pixel detected.Type: GrantFiled: December 23, 2013Date of Patent: March 24, 2015Assignee: Seiko Epson CorportionInventor: Tatsuo Urushidani
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Publication number: 20140375996Abstract: A light measurement device comprising an optical sensor that includes a tunable interference filter and a detecting section detecting light passed through the tunable filter, a storing section that stores a first correlation data and a second correlation data, and a CPU that obtains amount of the light by controlling the optical sensor based on the first correlation data and a second correlation data.Type: ApplicationFiled: September 12, 2014Publication date: December 25, 2014Inventor: Tatsuo URUSHIDANI
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Publication number: 20140320854Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength ?1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength ?2 different from the first wavelength as a center wavelength.Type: ApplicationFiled: July 8, 2014Publication date: October 30, 2014Inventors: Tomonori MATSUSHITA, Tatsuo URUSHIDANI
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Patent number: 8860950Abstract: A light measurement device comprising an optical sensor that includes a tunable interference filter and a detecting section detecting light passed through the tunable filter, a storing section that stores a first correlation data and a second correlation data, and a CPU that obtains amount of the light by controlling the optical sensor based on the first correlation data and a second correlation data.Type: GrantFiled: September 28, 2011Date of Patent: October 14, 2014Assignee: Seiko Epson CorporationInventor: Tatsuo Urushidani
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Patent number: 8817267Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength ?1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength ?2 different from the first wavelength as a center wavelength.Type: GrantFiled: August 17, 2011Date of Patent: August 26, 2014Assignee: Seiko Epson CorporationInventors: Tomonori Matsushita, Tatsuo Urushidani
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Publication number: 20140185046Abstract: A food analysis device includes a variable wavelength interference filter adapted to disperse light reflected by the food into a plurality of lights with respective wavelengths, an imaging section adapted to image the lights with the respective wavelengths obtained by the dispersion to obtain spectral images corresponding respectively to the wavelengths, and a control section adapted to obtain spectrum of each of the pixels from the spectral images corresponding to the respective wavelengths, and then detect a pixel including the absorption spectrum of water, and then detect a plurality of components based on the spectrum of the pixel detected.Type: ApplicationFiled: December 23, 2013Publication date: July 3, 2014Applicant: Seiko Epson CorporationInventor: Tatsuo URUSHIDANI
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Publication number: 20120212823Abstract: An etalon as a tunable interference filter includes a first substrate, a second substrate, a fixed mirror, a movable mirror, and an electrostatic actuator. The respective mirrors are formed by stacking one layer of a TiO2 film and one layer of an alloy film. A film thickness dimension of the TiO2 film and a film thickness dimension of the Ag alloy film are set to film thicknesses such that reflectance of a reference wavelength may be target reflectance and reflectance of a set wavelength may be lower than that of the case where the reflection film is formed only by the metal film.Type: ApplicationFiled: February 16, 2012Publication date: August 23, 2012Applicant: SEIKO EPSON CORPORATIONInventors: Tatsuaki FUNAMOTO, Tatsuo URUSHIDANI
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Publication number: 20120127471Abstract: An interference filter includes a fixed mirror and a movable mirror which are disposed so as to face each other with a gap therebetween. The fixed mirror is formed by laminating a one-layer TiO2 film and a one-layer Ag alloy film. In addition, the movable mirror is formed by laminating a one-layer TiO2 film and a one-layer Ag alloy film.Type: ApplicationFiled: September 30, 2011Publication date: May 24, 2012Applicant: SEIKO EPSON CORPORATIONInventor: Tatsuo URUSHIDANI
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Publication number: 20120109584Abstract: A light measurement device comprising an optical sensor that includes a tunable interference filter and a detecting section detecting light passed through the tunable filter, a storing section that stores a first correlation data and a second correlation data, and a CPU that obtains amount of the light by controlling the optical sensor based on the first correlation data and a second correlation data.Type: ApplicationFiled: September 28, 2011Publication date: May 3, 2012Applicant: SEIKO EPSON CORPORATIONInventor: Tatsuo URUSHIDANI
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Publication number: 20120044492Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength ?1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength ?2 different from the first wavelength as a center wavelength.Type: ApplicationFiled: August 17, 2011Publication date: February 23, 2012Applicant: SEIKO EPSON CORPORATIONInventors: Tomonori MATSUSHITA, Tatsuo URUSHIDANI
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Publication number: 20120044491Abstract: An optical filter includes a first substrate, a second substrate facing the first substrate, a first optical film provided to the first substrate, and a second optical film provided to the second substrate and facing the first optical film, and at least one of the first optical film and the second optical film has a metal film having a reflecting property and transmissibility of a light in a desired wavelength band, and a surface and an edge portion of the metal film is covered by a dielectric film. It is also possible to provide a tilted surface to an edge portion of the metal film. Further, it is also possible to form a step-like bump between the metal film and a dielectric film as another optical film formed under the metal film.Type: ApplicationFiled: August 15, 2011Publication date: February 23, 2012Applicant: SEIKO EPSON CORPORATIONInventors: Tatsuo URUSHIDANI, Yasushi MATSUNO