Abstract: A simulation apparatus according to an embodiment performs an electromagnetic field circuit coupling analysis on a first substrate and a second substrate electrically coupled via a circuit element having a finite delay time. A first coupling analysis unit carries out a time domain electromagnetic field analysis and also a circuit analysis on a circuit element at a first analytical domain including the first substrate. The second coupling analysis unit carries out a time domain electromagnetic field analysis and also a circuit analysis on a circuit element at a second analytical domain including the second substrate.

Abstract: In Internal Analysis Space analysis, assuming that no structural body and the like are placed outside of a conversion surface, an electromagnetic field distribution u0 inside of a conversion surface, on a conversion surface, and close to the outside of the conversion surface is found. In External Analysis Space analysis, on the assumption that there exists a structural body and the like outside of the conversion surface, an entire electromagnetic field distribution u is found. At this time, for the inside of the closed surface, an electric field distribution, where a differential electromagnetic field distribution e between electromagnetic field distribution u0 and electromagnetic field distribution u on the closed surface is a wave source, is found. Also at this time, for the outside of the closed surface, an electromagnetic field distribution, obtained by synthesizing electromagnetic field distribution u0 and electromagnetic field distribution e on the closed surface is found.

Abstract: A simulation apparatus according to an embodiment performs an electromagnetic field circuit coupling analysis on a first substrate and a second substrate electrically coupled via a circuit element having a finite delay time. A first coupling analysis unit carries out a time domain electromagnetic field analysis and also a circuit analysis on a circuit element at a first analytical domain including the first substrate. The second coupling analysis unit carries out a time domain electromagnetic field analysis and also a circuit analysis on a circuit element at a second analytical domain including the second substrate.

Abstract: In IAS analysis, assuming that no structural body and the like are placed in a conversion surface outside, an electromagnetic field distribution u0 in a conversion surface inside, on a conversion surface, and close to the conversion surface outside is found. In EAS analysis, on the assumption that there exists a structural body and the like in the conversion surface outside, an entire electromagnetic field distribution u is found. At this time, for the closed surface inside, an electric field distribution where a differential electromagnetic field distribution e between electromagnetic field distribution u0 and electromagnetic field distribution u on the closed surface is a wave source, is found, and for the closed surface outside, an electromagnetic field distribution obtained by synthesizing electromagnetic field distribution u0 and electromagnetic field distribution e on the closed surface is a wave source is found.

Abstract: An analysis apparatus capable of analyzing a circuit even when the number of elements handled in a circuit analysis increases includes: a management unit receiving and dividing information into multiple pieces of information; a calculation unit calculating at least any one of a magnitude of an electric field and a magnitude of a magnetic field at a predetermined point of time for each of a circuit board and wiring; a conversion unit mutually converting at least any one of a magnitude of an electric field and a magnitude of a magnetic field and at least any one of a current value and a voltage value; and a circuit analysis unit calculating at least any one of a current value and a voltage value at a predetermined point of time for an element represented by any one of multiple pieces of information divided by the management unit.

Abstract: An analysis apparatus capable of analyzing a circuit even when the number of elements handled in a circuit analysis increases includes: a management unit receiving and dividing information into multiple pieces of information; a calculation unit calculating at least any one of a magnitude of an electric field and a magnitude of a magnetic field at a predetermined point of time for each of a circuit board and wiring; a conversion unit mutually converting at least any one of a magnitude of an electric field and a magnitude of a magnetic field and at least any one of a current value and a voltage value; and a circuit analysis unit calculating at least any one of a current value and a voltage value at a predetermined point of time for an element represented by any one of multiple pieces of information divided by the management unit.

Abstract: A distributed process control unit divides, in time and space, a main problem of finding a full time response of an analytic region into a plurality of sub-problems, allots the sub-problems to those of a plurality of calculating units which are capable of calculating a new sub-problem, to have the units perform analysis. Therefore, even when computational capacity or the like of calculating units should vary, analysis can be performed in accordance with the computational capacity of the overall system.