Abstract: A semiconductor device has an input/output terminal configured to input test patterns, a plurality of function blocks configured to be driven by power supply voltage supplied through separate power supply lines, an internal bus configured to send and receive at least the test patterns between the function blocks and the input/output terminal, and an input control circuit which is provided corresponding to each of the plurality of function blocks and switches whether to provide the test patterns on the internal bus to the corresponding function block based on a mode setting signal.

Abstract: An improved drive apparatus for a LC display screen is provided. The inventioned drive apparatus includes a programmable time setting means for changing drive currents in accordance with the size of the LC display screen. Depending upon the size of the LC display screen, it is necessary to change the drive current for charging up the display as promptly as possible at an initial stage of operation. The inventioned drive apparatus includes at least one time setting register means for programmably pre-setting a time according to the size of the display screen and a circuit selection means for providing a low resistor selection signal and a high resistor selection signal in accordance with the pre-set time of the time setting means.