Patents by Inventor Tatsushi Nomura
Tatsushi Nomura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10228552Abstract: In order to realize a high-speed switching of structured pattern, a structured illuminating microscopy includes a driving unit generating a sonic standing wave in a sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to a light modulator, an illuminating optical system making at least three diffracted components of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes on an observational object, an image-forming optical system forming an image by an observational light flux from the observational object on a detector, and a controlling unit controlling a contrast of an image by modulating at least one of an intensity of the exit light flux, an intensity of the observational light flux, and the detector with a modulating signal of 1/N frequency of the driving signal.Type: GrantFiled: November 28, 2016Date of Patent: March 12, 2019Assignee: NIKON CORPORATIONInventors: Tatsushi Nomura, Hisao Osawa, Naoki Fukutake
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Publication number: 20170276922Abstract: In order to realize a high-speed switching of structured pattern, a structured illuminating microscopy includes a driving unit generating a sonic standing wave in a sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to a light modulator, an illuminating optical system making at least three diffracted components of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes on an observational object, an image-forming optical system forming an image by an observational light flux from the observational object on a detector, and a controlling unit controlling a contrast of an image by modulating at least one of an intensity of the exit light flux, an intensity of the observational light flux, and the detector with a modulating signal of 1/N frequency of the driving signal.Type: ApplicationFiled: November 28, 2016Publication date: September 28, 2017Applicant: NIKON CORPORATIONInventors: Tatsushi NOMURA, Hisao OSAWA, Naoki FUKUTAKE
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Patent number: 9709785Abstract: A structured illumination apparatus includes a light modulator being disposed in an exit flux of light from a light source and in which a sonic wave propagation path is arranged in a direction traversing the exit flux of light; a driving unit generating a sonic standing wave in the sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to the light modulator; and an illuminating optical system making mutually different diffracted components of the exit flux of light passed through the sonic wave propagation path to be interfered with each other, and forming interference fringes of the diffracted components on an observational object.Type: GrantFiled: April 11, 2013Date of Patent: July 18, 2017Assignee: NIKON CORPORATIONInventor: Tatsushi Nomura
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Patent number: 9535241Abstract: In order to realize a high-speed switching of structured pattern, a structured illuminating microscopy includes a driving unit generating a sonic standing wave in a sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to a light modulator, an illuminating optical system making at least three diffracted components of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes on an observational object, an image-forming optical system forming an image by an observational light flux from the observational object on a detector, and a controlling unit controlling a contrast of an image by modulating at least one of an intensity of the exit light flux, an intensity of the observational light flux, and the detector with a modulating signal of 1/N frequency of the driving signal.Type: GrantFiled: October 31, 2013Date of Patent: January 3, 2017Assignee: NIKON CORPORATIONInventors: Tatsushi Nomura, Hisao Osawa, Naoki Fukutake
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Patent number: 9146393Abstract: A structured illumination apparatus includes a light modulator being disposed in a light path of an exit light flux from a light source, and in which a sonic wave propagation path is arranged in a direction traversing the exit light flux; a driving unit generating a sonic standing wave in the sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to the light modulator; an illuminating optical system making at least three diffracted lights of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes of the diffracted lights on an observational object; and a controlling unit controlling a contrast of the interference fringes by modulating a phase of at least one diffracted light among the diffracted lights in a predetermined pitch.Type: GrantFiled: December 3, 2013Date of Patent: September 29, 2015Assignee: NIKON CORPORATIONInventors: Tatsushi Nomura, Hisao Osawa, Naoki Fukutake
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Publication number: 20140092463Abstract: A structured illumination apparatus includes a light modulator being disposed in a light path of an exit light flux from a light source, and in which a sonic wave propagation path is arranged in a direction traversing the exit light flux; a driving unit generating a sonic standing wave in the sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to the light modulator; an illuminating optical system making at least three diffracted lights of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes of the diffracted lights on an observational object; and a controlling unit controlling a contrast of the interference fringes by modulating a phase of at least one diffracted light among the diffracted lights in a predetermined pitch.Type: ApplicationFiled: December 3, 2013Publication date: April 3, 2014Applicant: NIKON CORPORATIONInventors: Tatsushi NOMURA, Hisao OSAWA, Naoki FUKUTAKE
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Publication number: 20140055594Abstract: In order to realize a high-speed switching of structured pattern, a structured illuminating microscopy includes a driving unit generating a sonic standing wave in a sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to a light modulator, an illuminating optical system making at least three diffracted components of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes on an observational object, an image-forming optical system forming an image by an observational light flux from the observational object on a detector, and a controlling unit controlling a contrast of an image by modulating at least one of an intensity of the exit light flux, an intensity of the observational light flux, and the detector with a modulating signal of 1/N frequency of the driving signal.Type: ApplicationFiled: October 31, 2013Publication date: February 27, 2014Applicant: Nikon CorporationInventors: Tatsushi NOMURA, Hisao OSAWA, Naoki FUKUTAKE
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Publication number: 20130229665Abstract: A structured illumination apparatus includes a light modulator being disposed in an exit flux of light from a light source and in which a sonic wave propagation path is arranged in a direction traversing the exit flux of light; a driving unit generating a sonic standing wave in the sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to the light modulator; and an illuminating optical system making mutually different diffracted components of the exit flux of light passed through the sonic wave propagation path to be interfered with each other, and forming interference fringes of the diffracted components on an observational object.Type: ApplicationFiled: April 11, 2013Publication date: September 5, 2013Applicant: Nikon CorporationInventor: Tatsushi NOMURA
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Patent number: 7940309Abstract: An optical low pass filter includes: a light transmitting member (41); and a refractive index distribution generation means (42) that generates a refractive index distribution cyclically changing within the plane of the light transmitting member (41). The refractive index distribution generation means includes a piezoelectric element, for example, and generates the refractive index distribution by generating the compressional wave in the light transmitting member (41) with a high frequency voltage being applied to the piezoelectric element.Type: GrantFiled: September 15, 2005Date of Patent: May 10, 2011Assignee: Nikon CorporationInventors: Masaki Shiozawa, Tatsushi Nomura
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Publication number: 20070247733Abstract: An optical low pass filter includes: a light transmitting member (41); and a refractive index distribution generation means (42) that generates a refractive index distribution cyclically changing within the plane of the light transmitting member (41). The refractive index distribution generation means includes a piezoelectric element, for example, and generates the refractive index distribution by generating the compressional wave in the light transmitting member (41) with a high frequency voltage being applied to the piezoelectric element.Type: ApplicationFiled: September 15, 2005Publication date: October 25, 2007Applicant: NIK0N CORPORATIONInventors: Masaki Shiozawa, Tatsushi Nomura
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Patent number: 5796000Abstract: A vibrator is formed on a silicon substrate to become a base by the silicon-processing procedure and a thin film of a piezoelectric material is formed on the substrate by a method matching with the silicon-processing procedure. When an ac field of a frequency near the resonance frequency of the transverse vibration of the vibrator is applied to the thin film of the piezoelectric material, the piezoelectric reverse effect excites characteristic vibration in the vibrator. If a rotational motion is generated along the axis of the beam in that state, the Coriolis' force is generated in a direction perpendicular to both the axial direction and the vibration direction of the beam. This force deforms the beam in that direction. Detecting inductive charges produced in another piezoelectric thin film fixed on the vibrator because of the piezoelectric normal effect due to the deformation, the rotational, angular velocity can be obtained.Type: GrantFiled: July 2, 1996Date of Patent: August 18, 1998Assignee: Nikon CorporationInventors: Takamitsu Fujiu, Shunji Watanabe, Yoshinori Sango, Tatsushi Nomura
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Patent number: 5794080Abstract: When a power switch is turned on, first and second analog switches are turned on while a third analog switch is turned off. Accordingly, at the time of starting, a forced excitation driving circuit supplies to a vibrator an oscillation output pulse which is substantially at the resonance frequency of the vibrator, thereby forcibly driving the vibrator in an excitation manner. Thereafter, when the vibrator substantially attains its stationary state and thereby the charged voltage of a capacitor reaches a threshold value of an inverter, the first and second analog switches are turned off while the third analog switch is turned on. Accordingly, the output of a self-excitation circuit is supplied to the electrode of the vibrator so as to vibrate the vibrator in a self-excitation manner.Type: GrantFiled: June 13, 1996Date of Patent: August 11, 1998Assignee: Nikon CorporationInventors: Shunji Watanabe, Tatsushi Nomura, Takamitsu Fujiu, Yoshinori Sango, Toru Fujii, Tetsuo Hattori
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Patent number: 5765046Abstract: A piezoelectric angular velocity meter includes a piezoelectric element. The piezoelectric element includes a first piezoelectric element and a second piezoelectric element bonded to the first piezoelectric element. The second piezoelectric element includes a second member made of a piezoelectric crystal, and upper- and lower-surface electrodes sandwiching the second member. The first piezoelectric element is fixed to the upper-surface electrode of said second piezoelectric element with an adhesive. The first piezoelectric element includes a first member made of a piezoelectric crystal, upper-surface electrodes, and a lower-surface electrode. The upper- and lower-surface electrodes sandwich the first member of the first piezoelectric element. The piezoelectric element is supported by two support portions.Type: GrantFiled: April 10, 1996Date of Patent: June 9, 1998Assignee: Nikon CorporationInventors: Shunji Watanabe, Tatsushi Nomura, Takamitsu Fujiu, Yoshinori Sango, Toru Fujii, Tetsuo Hattori
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Patent number: 5689063Abstract: Without necessitating complicated operations, an image of a low to medium magnification and an image of a high magnification are efficiently observed by an optical microscope and by an atomic force microscope, respectively. In the atomic force microscope, an atomic force microscope probe, whose size has been reduced since a device for detecting interatomic force is provided by a piezoelectric film, piezoresistance, or the like, is disposed between an objective lens of the optical microscope and a sample to be observed or at a position of the objective lens when the objective lens and the probe are constructed so as to be interchangeable, thereby enabling the optical microscope to confirm a scanning position of the atomic force microscope.Type: GrantFiled: December 4, 1995Date of Patent: November 18, 1997Assignee: Nikon CorporationInventors: Takamitsu Fujiu, Shunji Watanabe, Tatsushi Nomura, Yoshinori Sango, Toru Fujii, Tetsuo Hattori
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Patent number: 5537863Abstract: A scanning probe microscope according to present invention comprises a cantilever for interaction with a surface, the cantilever having a self vibrator therein for vibrating the cantilever, the cantilever having a self strain detector therein. The self vibrator and self strain detector comprise a piezoelectric layer and electrodes, and the piezoelectric layer is disposed between these electrodes.Type: GrantFiled: July 15, 1994Date of Patent: July 23, 1996Assignee: Nikon CorporationInventors: Takamitsu Fujiu, Shunji Watanabe, Tatsushi Nomura, Toru Fujii, Yoshinori Sango