Patents by Inventor Tatsuya Ishiwatari

Tatsuya Ishiwatari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same, the probe assembly having a probe block, a probe, and a cooling device
    Patent number: 9146256
    Abstract: A probe assembly for inspecting power semiconductor devices, which includes a probe block having more than one probe holding hole, more than one probe, each of which is contained in one of the probe holding holes with its outer surface being in contact with the inner surface of the probe holding hole, and which has lower end protruding from the probe block and coming into contact with the power semiconductor device on inspection, and one or more cooling units which cool the probe block. According to the probe assembly and the inspection apparatus, it is possible to inspect characteristics of power semiconductor devices accurately by suppressing temperature rises of the probes as well as the power semiconductor device under test.
    Type: Grant
    Filed: December 5, 2012
    Date of Patent: September 29, 2015
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Katsuo Yasuta, Hikaru Masuta, Hideki Nei, Tatsuya Ishiwatari