Patents by Inventor Tatsuya Nishihara

Tatsuya Nishihara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6686750
    Abstract: A semiconductor integrated circuit device is provided with an IC chip so as to prevent its circuits from malfunction when the IC chip is cracked. To detect chip cracks, a resistor R01 is disposed at the outer periphery of the area in which one wants to detect the chip crack. If the chip is cracked and the resistance value of the resistor R01 is changed, the resistance change is detected, thereby controlling internal signals such as the power on reset signal and stopping the whole operation of the circuit device so as to prevent the circuits from malfunction. Thus, the system security can also be improved.
    Type: Grant
    Filed: June 10, 2002
    Date of Patent: February 3, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Kazuki Watanabe, Ryouzou Yoshino, Kenji Nagai, Tatsuya Nishihara
  • Publication number: 20020153899
    Abstract: A semiconductor integrated circuit device is provided with an IC chip so as to prevent its circuits from malfunction when the IC chip is cracked. To detect chip cracks, a resistor R01 is disposed at the outer periphery of the area in which one wants to detect the chip crack. If the chip is cracked and the resistance value of the resistor R01 is changed, the resistance change is detected, thereby controlling internal signals such as the power on reset signal and stopping the whole operation of the circuit device so as to prevent the circuits from malfunction. Thus, the system security can also be improved.
    Type: Application
    Filed: June 10, 2002
    Publication date: October 24, 2002
    Applicant: Hitachi, Ltd.
    Inventors: Kazuki Watanabe, Ryouzou Yoshino, Kenji Nagai, Tatsuya Nishihara
  • Patent number: 6420883
    Abstract: A semiconductor integrated circuit device provided with an IC chip so as to prevent its circuits from malfunction when the IC chip is cracked. To detect chip cracks, a resistor R01 is disposed at the outer periphery of the area which wants to detect the chip crack. If the chip is cracked and the resistance value of the resistor R01 is changed, the resistance change is detected, thereby controlling internal signals such as the power on reset signal and stopping the whole operation of the circuit device so as to prevent the circuits from malfunction. Thus, the system security can also be improved.
    Type: Grant
    Filed: October 27, 1999
    Date of Patent: July 16, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Kazuki Watanabe, Ryouzou Yoshino, Kenji Nagai, Tatsuya Nishihara