Patents by Inventor Taufiq Habib

Taufiq Habib has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for automatic prediction of dynamic exposure
    Patent number: 9432572
    Abstract: In accordance with an example embodiment of the present invention, a method is disclosed. An image is provided. The image is transformed. A similarity score is determined. The similarity score corresponds to a comparison of the image and the transformed image. A camera setting is predicted based on the determined similarity score.
    Type: Grant
    Filed: December 1, 2014
    Date of Patent: August 30, 2016
    Assignee: HERE GLOBAL B.V.
    Inventors: Anish Mittal, I, Taufiq Habib
  • Method and Apparatus for Automatic Prediction of Dynamic Exposure
    Publication number: 20160156841
    Abstract: In accordance with an example embodiment of the present invention, a method is disclosed. An image is provided. The image is transformed. A similarity score is determined. The similarity score corresponds to a comparison of the image and the transformed image. A camera setting is predicted based on the determined similarity score.
    Type: Application
    Filed: December 1, 2014
    Publication date: June 2, 2016
    Applicant: HERE Global B.V.
    Inventors: Anish Mittal, Taufiq Habib
  • Through substrate optical imaging device and method
    Patent number: 8110804
    Abstract: A through-substrate optical imaging device for through-imaging of translucent work objects, includes a radiation source outputting radiation that will be transmissive through the work object and an imaging system configured for capturing inspection information from the radiation source through the work object. The radiation source is configured such that the radiation impinges on the surface of the work object under various angles of incidence. A method for through-substrate optical imaging of a translucent work object includes irradiating the translucent work object by radiation from a radiation source; capturing inspection information from the radiation source through the translucent work object, the inspection information being captured by an imaging system; and irradiating the translucent work object. The translucent work object is irradiated by radiation which impinges on the surface of the translucent work object under one of various angles of incidence and orientations.
    Type: Grant
    Filed: October 16, 2009
    Date of Patent: February 7, 2012
    Assignee: Viscom AG
    Inventors: Taufiq Habib, Alex F. Schreiner, Jon Marson
  • Through-substrate optical imaging device and method
    Publication number: 20100181483
    Abstract: A through-substrate optical imaging device for through-imaging of translucent work objects, includes a radiation source outputting radiation that will be transmissive through the work object and an imaging system configured for capturing inspection information from the radiation source through the work object. The radiation source is configured such that the radiation impinges on the surface of the work object under various angles of incidence. A method for through-substrate optical imaging of a translucent work object includes irradiating the translucent work object by radiation from a radiation source; capturing inspection information from the radiation source through the translucent work object, the inspection information being captured by an imaging system; and irradiating the translucent work object. The translucent work object is irradiated by radiation which impinges on the surface of the translucent work object under one of various angles of incidence and orientations.
    Type: Application
    Filed: October 16, 2009
    Publication date: July 22, 2010
    Inventors: Taufiq Habib, Alex F. Schreiner, Jon Marson