Patents by Inventor Teck Hui Wong

Teck Hui Wong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated circuit device testing in an inert gas
    Patent number: 10473712
    Abstract: A system includes an inert gas supply, a soak chamber, a test chamber, a transfer zone, and a heater. The soak chamber soaks an integrated circuit (IC) device in the inert gas prior to testing. The test chamber includes contact pins for testing the IC device in the inert gas by contacting the contact pins to leads of the IC device. The transfer zone is to transfer the IC device from the soak chamber to the test chamber. The heater heats the inert gas supplied to the soak chamber and the test chamber.
    Type: Grant
    Filed: December 27, 2016
    Date of Patent: November 12, 2019
    Assignee: Infineon Technologies AG
    Inventors: Nam Teck Shannon Teo, Giji Hervias Juele, Mohamed Rafi, Teck Hui Wong, Ming Xue
  • INTEGRATED CIRCUIT DEVICE TESTING IN AN INERT GAS
    Publication number: 20180180666
    Abstract: A system includes an inert gas supply, a soak chamber, a test chamber, a transfer zone, and a heater. The soak chamber soaks an integrated circuit (IC) device in the inert gas prior to testing. The test chamber includes contact pins for testing the IC device in the inert gas by contacting the contact pins to leads of the IC device. The transfer zone is to transfer the IC device from the soak chamber to the test chamber. The heater heats the inert gas supplied to the soak chamber and the test chamber.
    Type: Application
    Filed: December 27, 2016
    Publication date: June 28, 2018
    Applicant: Infineon Technologies AG
    Inventors: Nam Teck Shannon Teo, Giji Hervias Juele, Mohamed Rafi, Teck Hui Wong, Ming Xue