Patents by Inventor Ted Lekan

Ted Lekan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7454946
    Abstract: Systems, methods and circuits for implementing a self test in a slowly varying sensor. In one particular case, a circuit is provided that includes two filters operating in parallel. One of the filters is tailored for filtering normal operational signals, and operates at a first oversampling rate. The other filter is tailored for filtering test signals, and operates at a second oversampling rate. The second oversampling rate is generally less than the first oversampling rate. In various cases, the filter tailored for filtering normal operational signals may be programmed for operation across a plurality of oversampling rates.
    Type: Grant
    Filed: March 27, 2006
    Date of Patent: November 25, 2008
    Assignee: Texas Instruments Incorporated
    Inventors: Jeanne Krayer Pitz, Ted Lekan, Michael Vincze
  • Publication number: 20070050437
    Abstract: Systems, methods and circuits for generating random numbers. As one example, a system for generating random numbers is disclosed that includes an analog to digital conversion element that provides an output, and a digital filter that is electrically coupled to the analog to digital conversion element and provides an information signal based at least in part on the output. In addition, the system includes a memory device electrically coupled to a sequencer that generates a capture signal. The memory is operable to capture the information signal based at least in part on the capture signal.
    Type: Application
    Filed: August 25, 2005
    Publication date: March 1, 2007
    Applicant: Texas Instruments Incorporated
    Inventors: Jeanne Krayer Pitz, Ted Lekan
  • Publication number: 20060272382
    Abstract: Systems, methods and circuits for implementing a self test in a slowly varying sensor. In one particular case, a circuit is provided that includes two filters operating in parallel. One of the filters is tailored for filtering normal operational signals, and operates at a first oversampling rate. The other filter is tailored for filtering test signals, and operates at a second oversampling rate. The second oversampling rate is generally less than the first oversampling rate. In various cases, the filter tailored for filtering normal operational signals may be programmed for operation across a plurality of oversampling rates.
    Type: Application
    Filed: March 27, 2006
    Publication date: December 7, 2006
    Inventors: Jeanne Pitz, Ted Lekan, Michael Vincze
  • Patent number: 7032430
    Abstract: Systems, methods and circuits for implementing a self test in a slowly varying sensor. In one particular case, a circuit is provided that includes two filters operating in parallel. One of the filters is tailored for filtering normal operational signals, and operates at a first oversampling rate. The other filter is tailored for filtering test signals, and operates at a second oversampling rate. The second oversampling rate is generally less than the first oversampling rate. In various cases, the filter tailored for filtering normal operational signals may be programmed for operation across a plurality of oversampling rates.
    Type: Grant
    Filed: June 7, 2005
    Date of Patent: April 25, 2006
    Assignee: Texas Instruments Incorporated
    Inventors: Jeanne Krayer Pitz, Ted Lekan, Michael Vincze