Abstract: A substrate surface of a semiconductor package, comprising: a plurality of product forming areas to provide mounting spaces of semiconductor chips. The substrate surface also comprises a plurality of staggered offset mesh block areas surrounding the plurality of product forming areas. The plurality of staggered offset mesh block areas minimize mold bleeding from a mold cavity of the semiconductor package to outer areas of the substrate surface.

Abstract: A substrate surface of a semiconductor package, comprising: a plurality of product forming areas to provide mounting spaces of semiconductor chips. The substrate surface also comprises a plurality of staggered offset mesh block areas surrounding the plurality of product forming areas. The plurality of staggered offset mesh block areas minimize mold bleeding from a mold cavity of the semiconductor package to outer areas of the substrate surface.

Abstract: A method and structure of minimizing mold bleeding on a substrate surface of a semiconductor package is disclosed. In one embodiment, a method includes forming a dam structure on an outer area of a substrate surface of a semiconductor package and blocking a flow of a mold material from a mold cavity of the semiconductor package to the outer area of the substrate surface using the dam structure. In another embodiment, a substrate surface of a semiconductor package includes product forming areas to provide mounting spaces of semiconductor chips and staggered offset mesh block areas surrounding the product forming areas to act as dam structures to minimize mold bleeding from a mold cavity of the semiconductor package to outer areas of the substrate surface.

Abstract: A method and structure of minimizing mold bleeding on a substrate surface of a semiconductor package is disclosed. In one embodiment, a method includes forming a dam structure on an outer area of a substrate surface of a semiconductor package and blocking a flow of a mold material from a mold cavity of the semiconductor package to the outer area of the substrate surface using the dam structure. In another embodiment, a substrate surface of a semiconductor package includes product forming areas to provide mounting spaces of semiconductor chips and staggered offset mesh block areas surrounding the product forming areas to act as dam structures to minimize mold bleeding from a mold cavity of the semiconductor package to outer areas of the substrate surface.