Patents by Inventor Teh-Ming Hsieh
Teh-Ming Hsieh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9104612Abstract: Embodiments of the invention relate to a system comprising a processor, a burst detection module executing on the processor, and a resource monitor. The burst detection module is configured to receive a set of resource usages samples measuring an availability of a resource, calculate an absolute moving average (AMA) of the set of resource usage samples, calculate a mean dispersion of the set of resource usage samples, and determine that the set of resource usage samples comprises an aberrant sample by comparing the AMA to the mean dispersion. The resource monitor is configured to execute a recovery procedure in response to the determination that the set of resource usage samples comprise the aberrant sample.Type: GrantFiled: August 27, 2013Date of Patent: August 11, 2015Assignee: Oracle International CorporationInventors: Teh-Ming Hsieh, Liang Dong
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Publication number: 20150067405Abstract: Embodiments of the invention relate to a system comprising a processor, a burst detection module executing on the processor, and a resource monitor. The burst detection module is configured to receive a set of resource usages samples measuring an availability of a resource, calculate an absolute moving average (AMA) of the set of resource usage samples, calculate a mean dispersion of the set of resource usage samples, and determine that the set of resource usage samples comprises an aberrant sample by comparing the AMA to the mean dispersion. The resource monitor is configured to execute a recovery procedure in response to the determination that the set of resource usage samples comprise the aberrant sample.Type: ApplicationFiled: August 27, 2013Publication date: March 5, 2015Applicant: Oracle International CorporationInventors: Teh-Ming Hsieh, Liang Dong
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Patent number: 7904890Abstract: A mechanism is disclosed for determining how thoroughly a set of code has been tested. The mechanism involves identifying which portions within the set of code are interface portions and which portions are internal portions. A test is executed to test the set of code. Based upon a set of testing information derived from the test, an interface test metric is derived that provides a measure of how thoroughly the interface portions were tested by the test. Based upon the set of testing information, an internal test metric is derived that provides a measure of how thoroughly the internal portions were tested by the test. In one embodiment, an overall measure of how thoroughly the set of code has been tested by the test is derived, based upon the interface test metric and the internal test metric.Type: GrantFiled: September 19, 2006Date of Patent: March 8, 2011Assignee: Oracle America, Inc.Inventors: Teh-Ming Hsieh, Bing Y. Lin, Mark L. Blend
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Patent number: 7480900Abstract: A system and method for mapping software components (e.g., source files, binary files, modules) to test cases that test the components and providing rating information regarding each test case's effectiveness against its tested components. Each test case is applied to test a corresponding subset of the components, during which data are gathered (e.g., amount or elements of a component that were tested, which components were tested, time). Each test case is applied separately so that correlations between each test case and the corresponding subset of the software components can be recorded (and vice versa). A rating is generated to indicate how completely or effectively a test case covers a software component. A bipartite graph and/or other data structures may be constructed to map test cases to the software components they test, and vice versa.Type: GrantFiled: April 15, 2004Date of Patent: January 20, 2009Assignee: Sun Microsystems, Inc.Inventors: Charles Jianping Zhou, Teh-Ming Hsieh
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Patent number: 7092572Abstract: A method and apparatus are disclosed for testing the accuracy of digital test images generated by a computer graphics program executed on a computer graphics system. A test program is utilized to compare the test image with a reference image. The user defines regions of interest and a maximum error for each region. This allows the user to focus on a particular object or group of objects. Global image quantification verification generates one measurement of error or image difference for each region of the test image. Each region is divided into sub-regions and an average color value is calculated for each sub-region and the corresponding sub-region in the reference image. The differences between the averages for corresponding sub-regions in the test and reference images are calculated. A test image region may be unacceptably different from a reference image if a normalized sum of the absolute differences exceeds the maximum error.Type: GrantFiled: March 29, 2002Date of Patent: August 15, 2006Assignee: Sun Microsystems, Inc.Inventors: Shuangying Huang, Teh-Ming Hsieh, Tat Leung Chung, Lie-Hwang Hwang
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Patent number: 7092571Abstract: A method and apparatus are disclosed for testing the accuracy of digital test images generated by a computer graphics program executed on a computer graphics system. A test program is utilized to compare a test image with a reference image. Regional image quantification verification aims at an image comparison test that accepts minor color value differences and spatial shifts in rendered pixel values. The test image and reference image are divided into corresponding sub-regions. The average color value for each sub-region of the test image is compared to the average color value of the corresponding reference image sub-region and also to other nearby reference image sub-regions. A test image is unacceptably different from a reference image, if for any sub-region of the test image, no reference image sub-region is found with an average color value difference and spatial shift less than specified maximums.Type: GrantFiled: March 29, 2002Date of Patent: August 15, 2006Assignee: Sun Microsystems, Inc.Inventor: Teh-Ming Hsieh
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Patent number: 6961468Abstract: A method and apparatus are disclosed for testing the accuracy of digital images generated by a computer graphics program executed on a computer graphics system. A test program is utilized to compare test images with a set of reference images. Adaptive local image quantification verification aims at an image comparison that allows specified color value and spatial shifts. The color value for each pixel of a specified portion of the test image is compared to the average color value of an offset array of pixels in a reference image. A test image region may be unacceptably different from a reference image, if for any pixel of the test image region an offset reference image array is not found that has an array size, absolute color value difference, and spatial shift less than specified maximums.Type: GrantFiled: March 29, 2002Date of Patent: November 1, 2005Assignee: Sun Microsystems, Inc.Inventors: Shuangying Huang, Tat Leung Chung, Teh-Ming Hsieh, Lie-Hwang Hwang
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Patent number: 6691768Abstract: The present invention discloses improved heatsink designs and methods for cooling a heat source. One embodiment is a heatsink assembly for removing heat from an electronic component, the heatsink assembly comprising a copper-based core section having a first surface generally adapted to conform to an exposed mating surface of an electronic device and a second surface having a generally convex curvature having a greater surface area than the first surface. An aluminum-based outer section has a first surface comprising a concave curvature that is generally adapted to conform to the convex curvature of the core and a second surface. A plurality of fin elements protrude outwardly from the second surface of the outer section. At least one cooling fan can be positioned to direct airflow onto the fin elements. The core section can comprise a semi-spherical shape and can be joined by a finger-joint type connection to the outer section.Type: GrantFiled: June 25, 2001Date of Patent: February 17, 2004Assignee: Sun Microsystems, Inc.Inventors: Teh-Ming Hsieh, Bryan H. Tran, Julian A. Alipio
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Publication number: 20030185446Abstract: A method and apparatus are disclosed for testing the accuracy of digital test images generated by a computer graphics program executed on a computer graphics system. A test program is utilized to compare the test image with a reference image. The user defines regions of interest and a maximum error for each region. This allows the user to focus on a particular object or group of objects. Global image quantification verification generates one measurement of error or image difference for each region of the test image. Each region is divided into sub-regions and an average color value is calculated for each sub-region and the corresponding sub-region in the reference image. The differences between the averages for corresponding sub-regions in the test and reference images are calculated. A test image region may be unacceptably different from a reference image if a normalized sum of the absolute differences exceeds the maximum error.Type: ApplicationFiled: March 29, 2002Publication date: October 2, 2003Inventors: Shuangying Huang, Teh-Ming Hsieh, Tat Leung Chung, Lie-Hwang Hwang
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Publication number: 20030185447Abstract: A method and apparatus are disclosed for testing the accuracy of digital images generated by a computer graphics program executed on a computer graphics system. A test program is utilized to compare test images with a set of reference images. Adaptive local image quantification verification aims at an image comparison that allows specified color value and spatial shifts. The color value for each pixel of a specified portion of the test image is compared to the average color value of an offset array of pixels in a reference image. A test image region may be unacceptably different from a reference image, if for any pixel of the test image region an offset reference image array is not found that has an array size, absolute color value difference, and spatial shift less than specified maximums.Type: ApplicationFiled: March 29, 2002Publication date: October 2, 2003Inventors: Shuangying Huang, Tat Leung Chung, Teh-Ming Hsieh, Lie-Hwang Hwang
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Publication number: 20030185462Abstract: A method and apparatus are disclosed for testing the accuracy of digital test images generated by a computer graphics program executed on a computer graphics system. A test program is utilized to compare a test image with a reference image. Regional image quantification verification aims at an image comparison test that accepts minor color value differences and spatial shifts in rendered pixel values. The test image and reference image are divided into corresponding sub-regions. The average color value for each sub-region of the test image is compared to the average color value of the corresponding reference image sub-region and also to other nearby reference image sub-regions. A test image is unacceptably different from a reference image, if for any sub-region of the test image, no reference image sub-region is found with an average color value difference and spatial shift less than specified maximums.Type: ApplicationFiled: March 29, 2002Publication date: October 2, 2003Inventor: Teh-Ming Hsieh
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Publication number: 20030152275Abstract: A method and apparatus are disclosed for testing the accuracy of digital test images by comparing the value of each test image pixel with the average value of a corresponding reference image pixel array. The local image quantification verification test program accepts absolute differences between corresponding pixel and array values that are less than a specified difference maximum. The user may specify a difference maximum and a maximum array size, and may restrict the test image comparison to specified regions of the test image with specific difference tolerances for each region. This allows the user to focus the comparison on certain regions as more important than others and to focus a region on a particular object or group of objects.Type: ApplicationFiled: February 14, 2002Publication date: August 14, 2003Inventors: Tat Leung Chung, Teh-Ming Hsieh, Shuangying Huang, Lie-Hwang Hwang
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Publication number: 20020195229Abstract: The present invention discloses improved heatsink designs and methods for cooling a heat source. One embodiment is a heatsink assembly for removing heat from an electronic component, the heatsink assembly comprising a copper-based core section having a first surface generally adapted to conform to an exposed mating surface of an electronic device and a second surface having a generally convex curvature having a greater surface area than the first surface. An aluminum-based outer section has a first surface comprising a concave curvature that is generally adapted to conform to the convex curvature of the core and a second surface. A plurality of fin elements protrude outwardly from the second surface of the outer section. At least one cooling fan can be positioned to direct airflow onto the fin elements. The core section can comprise a semi-spherical shape and can be joined by a finger-joint type connection to the outer section.Type: ApplicationFiled: June 25, 2001Publication date: December 26, 2002Inventors: Teh-Ming Hsieh, Bryan H. Tran, Julian A. Alipio
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Patent number: 6226406Abstract: A method and apparatus are disclosed for testing the accuracy of images generated by a computer graphics program. An output image created by a graphics program on a particular computer platform is verified by being compared to a reference image, also known as the golden image. The output image is partitioned into several checking apertures where each such checking aperture can be of either a block type or a point type. In either case, each checking aperture is made up of several pixels. One or more attributes of the output image is compared against the reference image upon execution of a test program. For pixels in a point type checking aperture, a positional tolerance is determined. Expected values of pixels in the reference image are then derived by examining the specification of the computer graphics program. The positional tolerances and the expected values, along with color tolerances, are stored in a reference file.Type: GrantFiled: December 31, 1997Date of Patent: May 1, 2001Assignee: Sun Microsystems, Inc.Inventor: Teh-Ming Hsieh