Abstract: An oscillator circuit includes a phase-locked loop (PLL) with a plurality of voltage controlled oscillator (VCO), a clock divider circuit receiving the VCO phase outputs and outputting a first stage clock signal with an adjustable clock period related to the PLL period based on selecting a combination of two of the VCO phase outputs. The first stage clock signal has a balanced duty cycle at frequencies that are related to the PLL frequency by even fractional divisions of the VCO phase output period based on the quantity VCO phase outputs, and an unbalanced duty cycle at frequencies that are related by odd fractional divisions. A duty cycle adjustment (DCA) circuit receives the first stage clock signal selectively adjusts a falling edge of the first stage clock signal to provide an even duty cycle and feeds a resulting signal to the second stage clock signal output.

Abstract: An integrated circuit device comprising first circuitry including first logic devices and a clock tree for distributing a clock signal to the first logic devices and second circuitry comprising second logic devices, a first clock gater and a second clock gater. The first and second clock gaters comprise a programmable delay circuit.

Abstract: An integrated circuit device comprising first circuitry including first logic devices and a clock tree for distributing a clock signal to the first logic devices and second circuitry comprising second logic devices, a first clock gater and a second clock gater. The first and second clock gaters comprise a programmable delay circuit.

Abstract: A method, system and computer program product for extracting parasitic resistance and capacitance values to simulate performance of an integrated circuit. A selected number of interconnections in an integrated circuit may be identified (“interconnections of interest”). A netlist containing a list of the transistors in the integrated circuit may be pruned by selecting those transistors in the netlist that are in the channel connected regions on the driving side of the interconnections of interest and those on the receiving side of the interconnections of interest. Parasitic resistance and capacitance values for layout layers connected to the interconnections of interest may be extracted. These extracted parasitic resistance and capacitance values may be associated with the transistors connected to those layout layers in the pruned netlist.

Abstract: A method, system and computer program product for extracting parasitic resistance and capacitance values to simulate performance of an integrated circuit. A selected number of interconnections in an integrated circuit may be identified (“interconnections of interest”). A netlist containing a list of the transistors in the integrated circuit may be pruned by selecting those transistors in the netlist that are in the channel connected regions on the driving side of the interconnections of interest and those on the receiving side of the interconnections of interest. Parasitic resistance and capacitance values for layout layers connected to the interconnections of interest may be extracted. These extracted parasitic resistance and capacitance values may be associated with the transistors connected to those layout layers in the pruned netlist.