Patents by Inventor Terence W. Spoor

Terence W. Spoor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6281692
    Abstract: Disclosed is an interposer and test structure for making contact between a substrate and a test bed. One embodiment of the interposer has a floating, rigid conductive element in a nonconductive body which makes temporary contact between the test bed and the substrate. In another embodiment of the invention, the interposer includes two layers of material, in which one layer includes pogo pins for contacting the substrate and the other layer includes pads for contacting the test bed. The pogo pins are on a grid spacing corresponding to that of the substrate input/output pads while the interposer pads are on a grid spacing corresponding to that of the pogo pin contactors of the test bed.
    Type: Grant
    Filed: October 5, 1998
    Date of Patent: August 28, 2001
    Assignee: International Business Machines Corporation
    Inventors: Paul F. Bodenweber, Ralph R. Comulada, Mukta S. Farooq, Charles J. Hendricks, Philo B. Hodge, Vincent P. Peterson, Terence W. Spoor, Kathleen M. Wiley, Yuet-Ying Yu
  • Patent number: 5600883
    Abstract: Testing probes in a testing apparatus are supported in a unitary structure to provide rigidity of the supports for the probes in testing. The spring probes have a contact head at the distal end from the probe tip with a set of antirotation tabs which lock in a cooperating antirotation slot in the probe guide. The contact head has a cone-shaped pilot at its tip which is engaged with a gold-plated contact spring. The inner diameter is integrally in contact with the pilot by mechanical engagement or bonding by soldering or laser welding or the like.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: February 11, 1997
    Assignee: International Business Machines Corporation
    Inventors: Louis H. Faure, Terence W. Spoor
  • Patent number: 5521519
    Abstract: Testing probes in a testing apparatus are supported in a unitary structure to provide rigidity of the supports for the probes in testing. The spring probes have a contact head at the distal end from the probe tip with a set of antirotation tabs which lock in a cooperating antirotation slot in the probe guide. The contact head has a cone-shaped pilot at its tip which is engaged with a gold-plated contact spring. The inner diameter is integrally in contact with the pilot by mechanical engagement or bonding by soldering or laser welding or the like.
    Type: Grant
    Filed: December 29, 1993
    Date of Patent: May 28, 1996
    Assignee: International Business Machines Corporation
    Inventors: Louis H. Faure, Terence W. Spoor
  • Patent number: 5493864
    Abstract: A manifold design which provides for highly efficient cooling or heating of flowing liquids using a small number of thermoelectric elements is constructed of a thermally insulting material. On exterior surface of at least two sides of the manifold, open channel are formed for use in defining a liquid flow path. On the interior of the manifold there are a plurality of internal chambers, one internal chamber for each side having an exterior channel. These internal chambers are essentially equal in size and are preferably symmetrically disposed within the manifold in alignment with the sides. The channels on the outside of the manifold and the chambers on the inside of the manifold are connected in such a way that liquid would flow in an alternating series of channel and chamber in a single liquid flow path through the manifold. The channels on the exterior of the manifold are sealed by placing a thermally conductive cover plate over each side of the manifold.
    Type: Grant
    Filed: June 14, 1994
    Date of Patent: February 27, 1996
    Assignee: On Demand Cooling Systems, Inc.
    Inventors: Andrew T. S. Pomerene, Terence W. Spoor, Robert R. DeVenuto, Anthony V. DiStefano
  • Patent number: 5367254
    Abstract: A test probe assembly is disclosed having bucking beam displacement test probe units which are easily replaceable. Each test probe unit includes a wire and a slotted tube containing the wire,one end of the wire being attached to one end of the tube and the other end of the wire protruding from the other end of the tube. The wire slidably engages an inner diameter of the tube. Each tube is slotted at a plurality of locations along the longitudinal axis thereof to provide spaces for the buckling beam displacement of the respective wire when the protruding end of the wire is brought to bear against a device point to be tested. The slots are staggered so that adjacent ones are disposed radially opposite to each other with some overlap along the longitudinal axis of the tube. The test probe units are inserted in predetermined respective holes of an apertured block of insulating material in accordance with a pattern of device points to be tested.
    Type: Grant
    Filed: February 1, 1993
    Date of Patent: November 22, 1994
    Assignee: International Business Machines Corporation
    Inventors: Louis H. Faure, Terence W. Spoor