Abstract: Systems, apparatuses, and methods for enabling sensor discovery in autonomous devices herein. An example device to perform system-level verification predictions includes a neural network circuit including a neural network. During a first phase, the neural network circuit to train the neural network using respective assembly-level test data and the system-level verification test data associated with each of a first plurality of semiconductor dice. The first plurality of semiconductor dice is produced from a plurality of training wafers. During a second phase, the neural network circuit to determine, using the neural network, a system-level pass/fail decision for each of second plurality of semiconductor dice based on respective assembly-level test data associated with each of the second plurality of semiconductor dice. The second plurality of semiconductor dice is produced from a plurality of production wafers.