Abstract: An optical analysis system for measuring compositions of a sample includes a light source radiating a first light. A modulator disposed in a ray path of the light modulates the light to a desired frequency. A spectral element filters the light for a spectral range of interest of the sample. An optical filter receives a first light beam split from the light reflecting from the sample and optically filters data carried by the first light beam into at least one orthogonal component of the first light beam. A first detector measures a property of the orthogonal component. A second detector receives a second light beam split from the light reflecting from the sample for comparison of the property of the orthogonal component to the second light beam. An accelerometer senses when to acquire data from the sample.

Abstract: An optical analysis system includes a light source configured to radiate a first light along a first ray path; a modulator disposed in the first ray path, the modulator configured to modulate the first light to a desired frequency; a spectral element disposed proximate the modulator, the spectral element configured to filter the first light for a spectral range of interest of a sample; a cavity in communication with the spectral element, the cavity configured to direct the first light in a direction of the sample; a conical mirror configured to convert the first light reflecting from the sample into a second light, the cavity being further configured to direct the second light; a beamsplitter configured to split the second light into a first beam and a second beam; an optical filter mechanism disposed to receive the first beam, the optical filter mechanism configured to optically filter data carried by the first beam into at least one orthogonal component of the first beam; a first detector mechanism in commu