Abstract: A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.

Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck.

Abstract: A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

Abstract: A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.

Abstract: A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.

Abstract: This invention is an apparatus for a lawn mower having a rotating blade enclosed by a deck. A grass catching hopper is removably secured to the mower. A first conduit communicates with the deck or, in another embodiment, with a blower which induces increased airflow and moves grass clips and debris to the hopper interior. Controlled and enhanced air flow results from an air flow insert in the first conduit entrance. Air and entrained materials collide with a hopper interior wall, and a large amount of entrained materials drop to the hopper floor. Air and the small amount of entrained materials remaining in it are directed back toward the first wall and through an opening to a centrifugal chamber. Small openings in the chamber permit the passage of air flow and entrained materials into the hopper. Air and what remains of the entrained materials are then drawn out of the chamber and back to the intake of the blower through a second conduit.

Abstract: A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.

Abstract: This invention is an apparatus for a lawn mower having a rotating blade enclosed by a deck. A grass catching hopper is removably secured to the mower. A first conduit communicates with a blower which induces increased airflow and moves grass clips and debris to the hopper interior. Controlled and enhanced air flow results from an air flow insert in the first conduit entrance. Air and entrained materials collide with a hopper interior wall, and a large amount of entrained materials drop to the hopper floor. Air and the small amount of entrained materials remaining in it are directed back toward the first wall and through an opening to a chamber containing a baffle system. Baffles within the baffle system sequentially engage air and entrained materials more of which fall to the floor of the baffle chamber. Air and what remains of the entrained materials are then drawn out of the chamber and back to the intake of the blower through a second conduit.

Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck.