Abstract: A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.

Abstract: A test device for testing relays is provided. The test device includes a chassis and a plurality of generator components removably coupled to the chassis. Each of the plurality of generator components have a signal generator, a CPU to promote test signal generation by the signal generator, and an amplifier to amplify signals generated by the signal generator. The test device also includes a controller coupled to communicate with the plurality of generator components.

Abstract: A system for generating a signal for testing a relay is provided. The system includes a plurality of argument vector arrays, each defines a digital signal for testing the relay. Each of the argument vector arrays includes a plurality of argument vectors and each argument vector includes a plurality of arguments. The system includes a plurality of waveform generators to generate a plurality of signal components. Each waveform generator generates the signal component based on the argument vectors contained by a selected one of the plurality of argument vector arrays. The system also includes a merge component to combine the signal components to produce the digital signal for testing the relay.

Abstract: A test device for testing relays is provided. The test device includes a chassis and a plurality of generator components removably coupled to the chassis. Each of the plurality of generator components have a signal generator, a CPU to promote test signal generation by the signal generator, and an amplifier to amplify signals generated by the signal generator. The test device also includes a controller coupled to communicate with the plurality of generator components.