Patents by Inventor Terry Farren

Terry Farren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Discrete device testing
    Patent number: 8174779
    Abstract: One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: May 8, 2012
    Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
    Inventors: Terry Farren, Heng Gong, Yong Shen, Jing Zhang
  • Media defect removal in disk drive head testing
    Patent number: 7848037
    Abstract: A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.
    Type: Grant
    Filed: November 19, 2007
    Date of Patent: December 7, 2010
    Assignee: Hitachi Global Storage Technologies, Netherlands, B.V.
    Inventors: Youping Deng, Terry Farren, Jing Zhang
  • Media defect removal in disk drive head testing
    Publication number: 20090128142
    Abstract: A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.
    Type: Application
    Filed: November 19, 2007
    Publication date: May 21, 2009
    Inventors: Youping Deng, Terry Farren, Jing Zhang
  • Discrete device testing
    Publication number: 20080104449
    Abstract: One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.
    Type: Application
    Filed: October 31, 2006
    Publication date: May 1, 2008
    Inventors: Terry Farren, Heng Gong, Yong Shen, Jing Zhang
  • System, method, and apparatus for dynamic electrical testing of workpieces by multiplexing test sites with shared electronics
    Patent number: 7288935
    Abstract: A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.
    Type: Grant
    Filed: April 15, 2005
    Date of Patent: October 30, 2007
    Assignee: Hitachi Global Storage Technologies Netherlands BV
    Inventors: Terry Farren, Yong Shen
  • System, method, and apparatus for dynamic electrical testing of workpieces by multiplexing test sites with shared electronics
    Publication number: 20060232271
    Abstract: A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.
    Type: Application
    Filed: April 15, 2005
    Publication date: October 19, 2006
    Inventors: Terry Farren, Yong Shen