Abstract: In an apparatus for testing an electronic device, a life of a measurement board is significantly extended by interposing a plate member between the measurement board and a device mounting member for accommodating the electronic device. The plate member has a plurality of rear pads to be brought into contact with each of the pads of the measurement board on a back surface thereof and a plurality of front pads electrically connected to each of the rear pads through via holes on a front surface thereof. The plate member is places between the measurement board and the device mounting member on testing the electronic device and can be readily replaced by a new one when it is worn away.

Abstract: A testing system selectively activates products of a semiconductor integrated circuit device mounted on a burn-in board, supplies test data signals to the products to see whether or not a defective product is mixed into the products, and a power distributor incorporated in the testing system supplies electric power only to the activated products so that non-activated products do not affect the test data signals.