Patents by Inventor Teruyuki Ishibashi

Teruyuki Ishibashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8479548
    Abstract: An electric wire sizing-cutting apparatus including an electric wire delivery apparatus, which is easily handled and can smoothly supply the electric wire without generating a kink, is provided. The electric wire delivery apparatus includes: a transfer means transferring an electric wire, which is delivered from an electric wire reel, along a longitudinal direction of the electric wire; a correcting means arranged between the electric wire reel and the transfer means and correcting a bending habit of the electric wire by allowing the electric wire to pass through between a plurality of rollers arranged zigzag; and a rotation controlling means arranged on an upstream-side of the correcting means and putting the electric wire between a pair of rollers biased in a direction approaching each other.
    Type: Grant
    Filed: June 13, 2008
    Date of Patent: July 9, 2013
    Assignee: Yazaki Corporation
    Inventors: Teruyuki Ishibashi, Koji Higuchi
  • Publication number: 20080314473
    Abstract: An electric wire sizing-cutting apparatus including an electric wire delivery apparatus, which is easily handled and can smoothly supply the electric wire without generating a kink, is provided. The electric wire delivery apparatus includes: a transfer means transferring an electric wire, which is delivered from an electric wire reel, along a longitudinal direction of the electric wire; a correcting means arranged between the electric wire reel and the transfer means and correcting a bending habit of the electric wire by allowing the electric wire to pass through between a plurality of rollers arranged zigzag; and a rotation controlling means arranged on an upstream-side of the correcting means and putting the electric wire between a pair of rollers biased in a direction approaching each other.
    Type: Application
    Filed: June 13, 2008
    Publication date: December 25, 2008
    Applicant: Yazaki Corporation
    Inventors: Teruyuki Ishibashi, Koji Higuchi
  • Patent number: 6819116
    Abstract: In a terminal crimped state testing method, in step S1, a reference waveform is created on the basis of a load when a terminal in a good crimped state is obtained, and the reference waveform is divided into plural reference waveform segments to set singular points. In step S2, the reference waveform segments containing singular points of the segments are integrated. In step S3, a characteristic waveform is created on the basis of the load when a crimping terminal to be tested is obtained. The characteristic waveform thus created is divided into plural sample waveform segments and the waveform segments corresponding to the reference waveform segments are integrated. In step S4, the integrated values of the reference waveform segments are compared with those of the sample waveform segments, thereby deciding whether the crimped state of the crimping terminal is good or not.
    Type: Grant
    Filed: February 22, 2002
    Date of Patent: November 16, 2004
    Assignee: Yazaki Corporation
    Inventors: Teruyuki Ishibashi, Kazuyoshi Tomikawa
  • Publication number: 20020130669
    Abstract: In a terminal crimped state testing method, in step S1, a reference waveform is created on the basis of a load when a terminal in a good crimped state is obtained, and the reference waveform is divided into plural reference waveform segments to set singular points. In step S2, the reference waveform segments containing singular points of the segments are integrated. In step S3, a characteristic waveform is created on the basis of the load when a crimping terminal to be tested is obtained. The characteristic waveform thus created is divided into plural sample waveform segments and the waveform segments corresponding to the reference waveform segments are integrated. In step S4, the integrated values of the reference waveform segments are compared with those of the sample waveform segments, thereby deciding whether the crimped state of the crimping terminal is good or not.
    Type: Application
    Filed: February 22, 2002
    Publication date: September 19, 2002
    Applicant: Yazaki Corporation
    Inventors: Teruyuki Ishibashi, Kazuyoshi Tomikawa