Patents by Inventor Tetsu INAHARA

Tetsu INAHARA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10098215
    Abstract: A learning unit in learning mode generates a cluster from a cluster analysis of data formed from frequency constituent data and state data, obtained from a sensor unit. An abnormality calculation unit computes, as abnormalities, the minimum values among distances to surfaces of the clusters of the data formed from the frequency constituent data and the state data, obtained when in predictive fault indicator sensing mode. A predictive fault indicator determination unit determines a predictive fault indicator of an X-ray tube by comparing the abnormalities with a predetermined threshold.
    Type: Grant
    Filed: April 27, 2015
    Date of Patent: October 9, 2018
    Assignee: Hitachi, Ltd.
    Inventors: Takashi Nakahara, Shinya Yuda, Takanori Aono, Tetsu Inahara, Yoshitaka Seki, Kouji Akita, Kiyomi Abe
  • Publication number: 20170188443
    Abstract: A learning unit in learning mode generates a cluster from a cluster analysis of data formed from frequency constituent data and state data, obtained from a sensor unit. An abnormality calculation unit computes, as abnormalities, the minimum values among distances to surfaces of the clusters of the data formed from the frequency constituent data and the state data, obtained when in predictive fault indicator sensing mode. A predictive fault indicator determination unit determines a predictive fault indicator of an X-ray tube by comparing the abnormalities with a predetermined threshold.
    Type: Application
    Filed: April 27, 2015
    Publication date: June 29, 2017
    Inventors: Takashi NAKAHARA, Shinya YUDA, Takanori AONO, Tetsu INAHARA, Yoshitaka SEKI, Kouji AKITA, Kiyomi ABE