Patents by Inventor Tetsu Ozawa

Tetsu Ozawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor apparatus testing arrangement and semiconductor apparatus testing method
    Patent number: 7355421
    Abstract: A semiconductor apparatus testing arrangement for testing a plurality of semiconductor devices produced on a semiconductor substrate, has a substrate on which a plurality of testing units are arranged, each unit comprising a probe needles corresponding to electrode terminals of the semiconductor device and electric conductor parts connected with the probe needles.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: April 8, 2008
    Assignee: Fujitsu Limited
    Inventors: Shigeyuki Maruyama, Yoshikazu Arisaka, Kazuhiro Tashiro, Takayuki Katayama, Tetsu Ozawa, Yuushin Kimura
  • Semiconductor apparatus testing arrangement and semiconductor apparatus testing method
    Publication number: 20070096761
    Abstract: A semiconductor apparatus testing arrangement for testing a plurality of semiconductor devices produced on a semiconductor substrate, has a substrate on which a plurality of testing units are arranged, each unit comprising a probe needles corresponding to electrode terminals of the semiconductor device and electric conductor parts connected with the probe needles.
    Type: Application
    Filed: January 26, 2006
    Publication date: May 3, 2007
    Applicant: FUJITSU LIMITED
    Inventors: Shigeyuki Maruyama, Yoshikazu Arisaka, Kazuhiro Tashiro, Takayuki Katayama, Tetsu Ozawa, Yuushin Kimura