Patents by Inventor Tetsuaki Saiji

Tetsuaki Saiji has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Light sensor, and detecting mechanism and light-measuring mechanism in analyzing device
    Patent number: 7382460
    Abstract: The present invention relates to an analyzing device provided with: a light-measuring mechanism (6) that includes a light-emitting unit for emitting light onto a test tool (7) to analyze a sample and a light-receiving unit for receiving reflection light from the test tool (7); and a detecting mechanism (4) for detecting whether or not the test tool exists in a target area, the mechanism including a light-emitting unit for emitting light onto the test tool (7) and a light-receiving unit for receiving reflection light from the test tool (7). In the light-measuring mechanism (6), the light-emitting unit and light-receiving unit are disposed such that the light emission axis of the light-emitting unit and the light reception axis of the light-receiving unit are parallel or substantially parallel to each other.
    Type: Grant
    Filed: November 20, 2003
    Date of Patent: June 3, 2008
    Assignee: Arkray, Inc.
    Inventors: Yukio Higashiisogawa, Junichi Oka, Tetsuaki Saiji
  • Tool for analyzing specimen
    Publication number: 20060140818
    Abstract: The present invention provides a sample analysis tool that can provide a sufficient amount of information accurately and allows an analyzer to read out the information without using any special mechanism. In a sample analysis tool 1 including a reagent layer 11 and an information recording layer 12 formed on a substrate 13, the information recording layer is composed of one region or divided into a plurality of regions, and each region is colored with a single color. Information is recorded using at least one of a combination of color intensities over the plurality of regions and an area of each region.
    Type: Application
    Filed: October 19, 2004
    Publication date: June 29, 2006
    Applicant: ARKRAY, Inc.
    Inventors: Hisashi Sakamoto, Takeshi Matsuda, Kouji Egawa, Tetsuaki Saiji
  • Light sensor, and detecting mechanism and light-measuring mechanism in analyzing device
    Publication number: 20060076523
    Abstract: The present invention relates to an analyzing device provided with: a light-measuring mechanism (6) that includes a light-emitting unit for emitting light onto a test tool (7) to analyze a sample and a light-receiving unit for receiving reflection light from the test tool (7); and a detecting mechanism (4) for detecting whether or not the test tool exists in a target area, the mechanism including a light-emitting unit for emitting light onto the test tool (7) and a light-receiving unit for receiving reflection light from the test tool (7). In the light-measuring mechanism (6), the light-emitting unit and light-receiving unit are disposed such that the light emission axis of the light-emitting unit and the light reception axis of the light-receiving unit are parallel or substantially parallel to each other.
    Type: Application
    Filed: November 20, 2003
    Publication date: April 13, 2006
    Applicant: ARKRAY, INC.
    Inventors: Yukio Higashiisogawa, Junichi Oka, Tetsuaki Saiji