Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle ?c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle ?c? of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.

Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength ?1 of a semi-conductor laser, and a step of interpolating intensity signals (I1?, I2?, . . . ) that would be obtained when the interference wave is sampled at positions (D1?, D2?, . . . ) of the movable mirror set on the basis of a wavelength ?0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1?, I2?, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength ?0.

Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle ?c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle ?c? of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.

Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength ?1 of a semi-conductor laser, and a step of interpolating intensity signals (I1?, I2?, . . . ) that would be obtained when the interference wave is sampled at positions (D1?, D2?, . . . ) of the movable mirror set on the basis of a wavelength ?0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1?, I2?, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength ?0.

Abstract: A depolarizer includes a pair of wedge-shaped plates made of an optically isotropic material, laid one on top of another such that the total thickness is constant and wedge-plate holding means for holding the pair of wedge plates separately. The wedge-plate holding means includes a pressure-applying section for applying pressure to each of the pair of wedge plates in a direction perpendicular to the thickness direction of the pair of wedge plates. The pressure-applying direction for one of the pair of wedge plates and the pressure-applying direction for the other of the pair of wedge plates intersect at an angle of 45 degrees.

Abstract: A circular dichroism (CD) spectrometer includes an alignment mechanism that automatically adjusts the elements thereof at appropriate positions. The spectrometer has a focusing-lens position-and-orientation adjustment mechanism which adjusts the position and the orientation of the detector-side focusing lens. It also has a detector rotation mechanism which adjusts the orientation of the detector. Firstly, a control PC monitors the CD spectrum of D form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum matches the reference spectrum related to the D form. Next, the control PC moniters CD spectrum of L form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum of the D and L forms become symmetrical. And, the rotation mechanism adjusts the orientation of the detector such that the intensity of the detector signal is maximized.

Abstract: A circular dichroism (CD) spectrometer includes an alignment mechanism that automatically adjusts the elements thereof at appropriate positions. The spectrometer has a focusing-lens position-and-orientation adjustment mechanism which adjusts the position and the orientation of the detector-side focusing lens. It also has a detector rotation mechanism which adjusts the orientation of the detector. Firstly, a control PC monitors the CD spectrum of D form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum matches the reference spectrum related to the D form. Next, the control PC moniters CD spectrum of L form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum of the D and L forms become symmetrical. And, the rotation mechanism adjusts the orientation of the detector such that the intensity of the detector signal is maximized.

Abstract: A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.

Abstract: A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.