Patents by Inventor Tetsunori Watanabe

Tetsunori Watanabe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11959165
    Abstract: There have been cases where transistors formed using oxide semiconductors are inferior in reliability to transistors formed using amorphous silicon. Thus, in the present invention, a semiconductor device including a highly reliable transistor formed using an oxide semiconductor is manufactured. An oxide semiconductor film is deposited by a sputtering method, using a sputtering target including an oxide semiconductor having crystallinity, and in which the direction of the c-axis of a crystal is parallel to a normal vector of the top surface of the oxide semiconductor. The target is formed by mixing raw materials so that its composition ratio can obtain a crystal structure.
    Type: Grant
    Filed: April 13, 2021
    Date of Patent: April 16, 2024
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Tetsunori Maruyama, Yuki Imoto, Hitomi Sato, Masahiro Watanabe, Mitsuo Mashiyama, Kenichi Okazaki, Motoki Nakashima, Takashi Shimazu
  • Patent number: 8604805
    Abstract: The invention provides a property monitoring apparatus comprising a test current output circuit capable of varying an output current, a test current value computing means for computing a current value of a test current output from the test current output circuit, a test current control means for performing feedback control of the test current value computed via the test current value computing means to a target value, a measurement current detection circuit for measuring an output current value of the current transformer or the voltage transformer when the test current controlled to the target value via the test current control means is supplied, for storing a relationship between the output current value of the current transformer or the voltage transformer and the test current value for each target value by varying the target value of the test current via a predetermined pattern, and computing a correction coefficient for correcting a property of the current transformer or the voltage transformer based on t
    Type: Grant
    Filed: June 25, 2010
    Date of Patent: December 10, 2013
    Assignee: Hitachi Industrial Equipment Systems Co., Ltd.
    Inventors: Kouji Satou, Toshiko Kimura, Tetsunori Watanabe
  • Publication number: 20110148431
    Abstract: The invention provides a property monitoring apparatus comprising a test current output circuit capable of varying an output current, a test current value computing means for computing a current value of a test current output from the test current output circuit, a test current control means for performing feedback control of the test current value computed via the test current value computing means to a target value, a measurement current detection circuit for measuring an output current value of the current transformer or the voltage transformer when the test current controlled to the target value via the test current control means is supplied, for storing a relationship between the output current value of the current transformer or the voltage transformer and the test current value for each target value by varying the target value of the test current via a predetermined pattern, and computing a correction coefficient for correcting a property of the current transformer or the voltage transformer based on t
    Type: Application
    Filed: June 25, 2010
    Publication date: June 23, 2011
    Inventors: Kouji SATOU, Toshiko Kimura, Tetsunori Watanabe
  • Patent number: 7171317
    Abstract: This invention is intended to reduce the cost by displaying the load information of a plurality of circuits with a single display device and transferring one of the two communication units in the measuring instruments from the measuring instruments to the display device to acquire the load information of a plurality of circuits. The display device and the measuring instruments are separated from each other, and the display device includes a plurality of communications units connectable with a plurality of devices, while each of many measuring instruments includes a single communication unit.
    Type: Grant
    Filed: February 23, 2005
    Date of Patent: January 30, 2007
    Assignee: Hitachi Industrial Equipment Systems Co., Ltd.
    Inventors: Kazuya Aihara, Kazuhiko Kato, Hideki Hayakawa, Tetsunori Watanabe, Toshiko Kimura
  • Publication number: 20060085148
    Abstract: This invention is intended to reduce the cost by displaying the load information of a plurality of circuits with a single display device and transferring one of the two communication units in the measuring instruments from the measuring instruments to the display device to acquire the load information of a plurality of circuits. The display device and the measuring instruments are separated from each other, and the display device includes a plurality of communications units connectable with a plurality of devices, while each of many measuring instruments includes a single communication unit.
    Type: Application
    Filed: February 23, 2005
    Publication date: April 20, 2006
    Inventors: Kazuya Aihara, Kazuhiko Kato, Hideki Hayakawa, Tetsunori Watanabe, Toshiko Kimura
  • Publication number: 20050225909
    Abstract: The system makes it possible to monitor various electrical variables by using a simple structure at low cost with ease and with high reliability by a circuit breaker which jointly includes a current transformer to detect current, a transformer to detect voltage, and a zero-phase current transformer to detect leakage current, in addition to the switch controller to perform the basic function of the circuit breaker. Moreover, the system also provides a function to display various measured values, obtained as described above, by a display unit that can be detached and installed separately from the measuring section to display data sent in digital form by data transmission.
    Type: Application
    Filed: August 18, 2004
    Publication date: October 13, 2005
    Applicant: Hitachi Industrial Equipment Co., Ltd.
    Inventors: Akio Yoshizaki, Naohiro Takakamo, Satoko Gotou, Hideki Hayakawa, Tetsunori Watanabe, Haruki Shibuya