Patents by Inventor Tetsuo Furuta

Tetsuo Furuta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9062963
    Abstract: Thickness measurement apparatuses 1 and 2 are set a preset distance Ld from each other. The first apparatus 1 performs calibration using a thickness reference plate 5c. While the second apparatus 2, placed on a downstream side in a conveying direction, is performing measurement process, mode setter 3 sets “measurement” for the first apparatus 1. Mode setter 3 further gives an instruction to start a “thickness correction” process to the second apparatus 2. Mode setter 3 delays a first thickness measurement value 1 until a position corresponding to the distance is reached in a traveling distance, determines the difference between the first value 1 and a second thickness measurement value 2 from the second apparatus 2 as a correction value, and executes thickness correction without halting the measurement performed by the second apparatus 2.
    Type: Grant
    Filed: May 29, 2014
    Date of Patent: June 23, 2015
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Tetsuo Furuta, Teruo Ishizuka
  • Publication number: 20140268183
    Abstract: Thickness measurement apparatuses 1 and 2 are set a preset distance Ld from each other. The first apparatus 1 performs calibration using a thickness reference plate 5c. While the second apparatus 2, placed on a downstream side in a conveying direction, is performing measurement process, mode setter 3 sets “measurement” for the first apparatus 1. Mode setter 3 further gives an instruction to start a “thickness correction” process to the second apparatus 2. Mode setter 3 delays a first thickness measurement value 1 until a position corresponding to the distance is reached in a traveling distance, determines the difference between the first value 1 and a second thickness measurement value 2 from the second apparatus 2 as a correction value, and executes thickness correction without halting the measurement performed by the second apparatus 2.
    Type: Application
    Filed: May 29, 2014
    Publication date: September 18, 2014
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Tetsuo Furuta, Teruo Ishizuka