Patents by Inventor Tetsuya Isobe

Tetsuya Isobe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240105826
    Abstract: A semiconductor device of an embodiment includes a semiconductor layer, a first insulating film provided on the semiconductor layer, a first electrode film provided on the first insulating film, a second electrode film provided on the first electrode film, and a first field plate electrode provided on the second electrode film. A lower end of the first field plate electrode is located on a second surface of the first electrode film, the second surface being in contact with the second electrode film, rather than a first surface of the first electrode film, the first surface being in contact with the first insulating film.
    Type: Application
    Filed: March 1, 2023
    Publication date: March 28, 2024
    Inventors: Hitoshi KOBAYASHI, Masaaki ONOMURA, Toru SUGIYAMA, Akira YOSHIOKA, Hung HUNG, Hideki SEKIGUCHI, Tetsuya OHNO, Yasuhiro ISOBE
  • Publication number: 20240105563
    Abstract: A semiconductor device includes a nitride semiconductor element, a first diode, and a second diode; the nitride semiconductor element includes a conductive mounting bed, a semiconductor substrate formed on the mounting bed, a first nitride semiconductor layer, a second nitride semiconductor layer, a first major electrode, a second major electrode, a first gate electrode, and a second gate electrode; the first diode includes a first anode electrode electrically connected to the mounting bed, and a first cathode electrode electrically connected to the first major electrode; and the second diode includes a second anode electrode electrically connected to the mounting bed, and a second cathode electrode electrically connected to the second major electrode.
    Type: Application
    Filed: March 9, 2023
    Publication date: March 28, 2024
    Inventors: Toru SUGIYAMA, Akira YOSHIOKA, Hitoshi KOBAYASHI, Hung HUNG, Yasuhiro ISOBE, Hideki SEKIGUCHI, Tetsuya OHNO, Masaaki ONOMURA
  • Publication number: 20240097671
    Abstract: A semiconductor device includes a first transistor, a first drive circuit including a second transistor, and a second drive circuit including a third transistor. The second transistor and the third transistor are connected in series; and a connection node of the second and third transistors is connected to a gate electrode of the first transistor. The first transistor, the second transistor, and the third transistor are normally-off MOS HEMTs formed in a first substrate that includes GaN. The first drive circuit charges a parasitic capacitance of the first transistor. The second drive circuit discharges the parasitic capacitance of the first transistor.
    Type: Application
    Filed: February 10, 2023
    Publication date: March 21, 2024
    Inventors: Toru SUGIYAMA, Noriaki YOSHIKAWA, Yasuhiko KURIYAMA, Akira YOSHIOKA, Hitoshi KOBAYASHI, Hung HUNG, Yasuhiro ISOBE, Tetsuya OHNO, Hideki SEKIGUCHI, Masaaki ONOMURA
  • Patent number: 9636681
    Abstract: A test tube holder holds various types of test tubes substantially perpendicular, and is structured to be durable against extraction and insertion of the test tubes. The test tube holder includes a housing part having a hollow portion, a holding part positioned on an upper side of the housing part and having an opening portion, which accepts a test tube, and a housing portion, which houses the accepted test tube. An elastic part is formed inside the holding part so as to abut on the housed test tube. The test tube holder has a weight housed inside the hollow portion. The holding part and the elastic part may be integrally formed. Inside the hollow portion of the housing part, besides the weight, an individual identification tag, an electromagnetic wave absorbent, and a support member for a tapered test tube can be housed in accordance with usage.
    Type: Grant
    Filed: December 4, 2015
    Date of Patent: May 2, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Kuniaki Onizawa
  • Publication number: 20160144367
    Abstract: A test tube holder holds various types of test tubes substantially perpendicular, and is structured to be durable against extraction and insertion of the test tubes. The test tube holder includes a housing part having a hollow portion, a holding part positioned on an upper side of the housing part and having an opening portion, which accepts a test tube, and a housing portion, which houses the accepted test tube. An elastic part is formed inside the holding part so as to abut on the housed test tube. The test tube holder has a weight housed inside the hollow portion. The holding part and the elastic part may be integrally formed. Inside the hollow portion of the housing part, besides the weight, an individual identification tag, an electromagnetic wave absorbent, and a support member for a tapered test tube can be housed in accordance with usage.
    Type: Application
    Filed: December 4, 2015
    Publication date: May 26, 2016
    Inventors: Hiroshi OHGA, Tatsuya FUKUGAKI, Tetsuya ISOBE, Kuniaki ONIZAWA
  • Patent number: 9291633
    Abstract: After being dispensed, a sample that needs to be quickly measured passes through another unit and is transported to an automatic analyzer. A plurality of units are provided for functions of processing including a dispensing unit that dispenses the sample stored in a sample vessel into another sample vessel. At least one discharge line discharges the sample from the dispensing unit to a transport line and a line that is perpendicular to the discharge line. A reverse direction transport line transports the sample in a direction reverse to a direction in which the sample loaded in the system is transported to the dispensing unit. The sample that is processed by the dispensing unit is transported to a storage unit located on the upstream side of the system, through the reverse direction transport line.
    Type: Grant
    Filed: September 9, 2010
    Date of Patent: March 22, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Shigeru Yano
  • Patent number: 9211543
    Abstract: A test tube holder holds various types of test tubes substantially perpendicular, and is structured to be durable against extraction and insertion of the test tubes. The test tube holder includes a housing part having a hollow portion, a holding part positioned on an upper side of the housing part and having an opening portion, which accepts a test tube, and a housing portion, which houses the accepted test tube. An elastic part is formed inside the holding part so as to abut on the housed test tube. The test tube holder has a weight housed inside the hollow portion. The holding part and the elastic part may be integrally formed. Inside the hollow portion of the housing part, besides the weight, an individual identification tag, an electromagnetic wave absorbent, and a support member for a tapered test tube can be housed in accordance with usage.
    Type: Grant
    Filed: December 14, 2012
    Date of Patent: December 15, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Kuniaki Onizawa
  • Patent number: 8956568
    Abstract: A sample transfer mechanism of the present invention is characterized broadly by a sample gripping method in which a downward part of a sample vessel is gripped and a cover that achieves an effect as a guide such that gripping arms that grip the sample vessel avoid contact with other objects and bypass surrounding objects, particularly, the sample vessels in approaching and retracting motions. To enhance the effect as the guide and to ensure that the sample vessels can be mounted with a high degree of integration, the shape of the cover and disposition of the sample transfer mechanism are characterized in a number of manners. Thus, a sample transfer mechanism that can perform a transfer process safely with high throughput even under conditions in which a variety of types of sample vessels is mixed together and the sample vessels are mounted with a high degree of integration is provided.
    Type: Grant
    Filed: August 31, 2011
    Date of Patent: February 17, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Akihiro Ohiso, Yoshiteru Hirama, Tatsuya Fukugaki, Tetsuya Isobe, Hiroaki Sakai
  • Publication number: 20140301916
    Abstract: A test tube holder holds various types of test tubes substantially perpendicular, and is structured to be durable against extraction and insertion of the test tubes. The test tube holder includes a housing part having a hollow portion, a holding part positioned on an upper side of the housing part and having an opening portion, which accepts a test tube, and a housing portion, which houses the accepted test tube. An elastic part is formed inside the holding part so as to abut on the housed test tube. The test tube holder has a weight housed inside the hollow portion. The holding part and the elastic part may be integrally formed. Inside the hollow portion of the housing part, besides the weight, an individual identification tag, an electromagnetic wave absorbent, and a support member for a tapered test tube can be housed in accordance with usage.
    Type: Application
    Filed: December 14, 2012
    Publication date: October 9, 2014
    Inventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Kuniaki Onizawa
  • Patent number: 8833186
    Abstract: Conventional conveying lines have required building according to the particular shapes of test tube racks and test tube holders. For this reason, at least two types of dedicated lines, one for test tube racks and one for test tube holders, have been needed in one system, so there has been a tendency for systems to be complex in structure and disadvantageous in cost. To solve these problems, this invention provides a sample conveying system designed so that test tube racks and test tube holders can move on the same line, and high in both cost-effectiveness and reliability.
    Type: Grant
    Filed: September 8, 2010
    Date of Patent: September 16, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tetsuya Isobe, Hiroshi Ohga, Masaaki Hanawa, Tatsuya Fukugaki
  • Publication number: 20130149079
    Abstract: A sample transfer mechanism of the present invention is characterized broadly by a sample gripping method in which a downward part of a sample vessel is gripped and a cover that achieves an effect as a guide such that gripping arms that grip the sample vessel avoid contact with other objects and bypass surrounding objects, particularly, the sample vessels in approaching and retracting motions. To enhance the effect as the guide and to ensure that the sample vessels can be mounted with a high degree of integration, the shape of the cover and disposition of the sample transfer mechanism are characterized in a number of manners. Thus, a sample transfer mechanism that can perform a transfer process safely with high throughput even under conditions in which a variety of types of sample vessels is mixed together and the sample vessels are mounted with a high degree of integration is provided.
    Type: Application
    Filed: August 31, 2011
    Publication date: June 13, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Akihiro Ohiso, Yoshiteru Hirama, Tatsuya Fukugaki, Tetsuya Isobe, Hiroaki Sakai
  • Publication number: 20120266698
    Abstract: Conventional conveying lines have required building according to the particular shapes of test tube racks and test tube holders. For this reason, at least two types of dedicated lines, one for test tube racks and one for test tube holders, have been needed in one system, so there has been a tendency for systems to be complex in structure and disadvantageous in cost. To solve these problems, this invention provides a sample conveying system designed so that test tube racks and test tube holders can move on the same line, and high in both cost-effectiveness and reliability.
    Type: Application
    Filed: September 8, 2010
    Publication date: October 25, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Tetsuya Isobe, Hiroshi Ohga, Masaaki Hanawa, Tatsuya Fukugaki
  • Publication number: 20120174687
    Abstract: After being dispensed, a sample that needs to be quickly measured passes through another unit and is transported to an automatic analyzer. A plurality of units are provided for functions of processing including a dispensing unit that dispenses the sample stored in a sample vessel into another sample vessel. At least one discharge line discharges the sample from the dispensing unit to a transport line and a line that is perpendicular to the discharge line. A reverse direction transport line transports the sample in a direction reverse to a direction in which the sample loaded in the system is transported to the dispensing unit. The sample that is processed by the dispensing unit is transported to a storage unit located on the upstream side of the system, through the reverse direction transport line.
    Type: Application
    Filed: September 9, 2010
    Publication date: July 12, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Shigeru Yano
  • Publication number: 20120129673
    Abstract: The weight difference is limited between buckets (17) mounted at respective symmetrical positions with respect to a centrifugal separation rotational center and examination of samples is continuously performed in the order in which they are received. In particular, when a sample (21) is carried in a centrifugal buffer line (11), its weight is measured by weight measuring means (31). It is assumed that the names of two adaptors (22) placed at respective symmetrical positions with respect to the centrifugal separation rotational center are defined as an adaptor A and an adaptor B. A first sample is put on the adaptor A and a second sample is put on the adaptor B. Then, a third sample and subsequent ones are each put on the adaptor (22) lighter than the other adaptor after the total weights of samples put on the adaptors are computation-compared with each other.
    Type: Application
    Filed: July 28, 2010
    Publication date: May 24, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Tatsuya Fukugaki, Hiroshi Oga, Shigemi Oba, Tetsuya Isobe, Kuniaki Onizawa
  • Patent number: D653351
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: January 31, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D653766
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: February 7, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D655422
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: March 6, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D655822
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: March 13, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D655823
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: March 13, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
  • Patent number: D658776
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: May 1, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda