Patents by Inventor Tetsuya Isobe
Tetsuya Isobe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240105826Abstract: A semiconductor device of an embodiment includes a semiconductor layer, a first insulating film provided on the semiconductor layer, a first electrode film provided on the first insulating film, a second electrode film provided on the first electrode film, and a first field plate electrode provided on the second electrode film. A lower end of the first field plate electrode is located on a second surface of the first electrode film, the second surface being in contact with the second electrode film, rather than a first surface of the first electrode film, the first surface being in contact with the first insulating film.Type: ApplicationFiled: March 1, 2023Publication date: March 28, 2024Inventors: Hitoshi KOBAYASHI, Masaaki ONOMURA, Toru SUGIYAMA, Akira YOSHIOKA, Hung HUNG, Hideki SEKIGUCHI, Tetsuya OHNO, Yasuhiro ISOBE
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Publication number: 20240105563Abstract: A semiconductor device includes a nitride semiconductor element, a first diode, and a second diode; the nitride semiconductor element includes a conductive mounting bed, a semiconductor substrate formed on the mounting bed, a first nitride semiconductor layer, a second nitride semiconductor layer, a first major electrode, a second major electrode, a first gate electrode, and a second gate electrode; the first diode includes a first anode electrode electrically connected to the mounting bed, and a first cathode electrode electrically connected to the first major electrode; and the second diode includes a second anode electrode electrically connected to the mounting bed, and a second cathode electrode electrically connected to the second major electrode.Type: ApplicationFiled: March 9, 2023Publication date: March 28, 2024Inventors: Toru SUGIYAMA, Akira YOSHIOKA, Hitoshi KOBAYASHI, Hung HUNG, Yasuhiro ISOBE, Hideki SEKIGUCHI, Tetsuya OHNO, Masaaki ONOMURA
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Publication number: 20240097671Abstract: A semiconductor device includes a first transistor, a first drive circuit including a second transistor, and a second drive circuit including a third transistor. The second transistor and the third transistor are connected in series; and a connection node of the second and third transistors is connected to a gate electrode of the first transistor. The first transistor, the second transistor, and the third transistor are normally-off MOS HEMTs formed in a first substrate that includes GaN. The first drive circuit charges a parasitic capacitance of the first transistor. The second drive circuit discharges the parasitic capacitance of the first transistor.Type: ApplicationFiled: February 10, 2023Publication date: March 21, 2024Inventors: Toru SUGIYAMA, Noriaki YOSHIKAWA, Yasuhiko KURIYAMA, Akira YOSHIOKA, Hitoshi KOBAYASHI, Hung HUNG, Yasuhiro ISOBE, Tetsuya OHNO, Hideki SEKIGUCHI, Masaaki ONOMURA
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Patent number: 9636681Abstract: A test tube holder holds various types of test tubes substantially perpendicular, and is structured to be durable against extraction and insertion of the test tubes. The test tube holder includes a housing part having a hollow portion, a holding part positioned on an upper side of the housing part and having an opening portion, which accepts a test tube, and a housing portion, which houses the accepted test tube. An elastic part is formed inside the holding part so as to abut on the housed test tube. The test tube holder has a weight housed inside the hollow portion. The holding part and the elastic part may be integrally formed. Inside the hollow portion of the housing part, besides the weight, an individual identification tag, an electromagnetic wave absorbent, and a support member for a tapered test tube can be housed in accordance with usage.Type: GrantFiled: December 4, 2015Date of Patent: May 2, 2017Assignee: Hitachi High-Technologies CorporationInventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Kuniaki Onizawa
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Publication number: 20160144367Abstract: A test tube holder holds various types of test tubes substantially perpendicular, and is structured to be durable against extraction and insertion of the test tubes. The test tube holder includes a housing part having a hollow portion, a holding part positioned on an upper side of the housing part and having an opening portion, which accepts a test tube, and a housing portion, which houses the accepted test tube. An elastic part is formed inside the holding part so as to abut on the housed test tube. The test tube holder has a weight housed inside the hollow portion. The holding part and the elastic part may be integrally formed. Inside the hollow portion of the housing part, besides the weight, an individual identification tag, an electromagnetic wave absorbent, and a support member for a tapered test tube can be housed in accordance with usage.Type: ApplicationFiled: December 4, 2015Publication date: May 26, 2016Inventors: Hiroshi OHGA, Tatsuya FUKUGAKI, Tetsuya ISOBE, Kuniaki ONIZAWA
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Patent number: 9291633Abstract: After being dispensed, a sample that needs to be quickly measured passes through another unit and is transported to an automatic analyzer. A plurality of units are provided for functions of processing including a dispensing unit that dispenses the sample stored in a sample vessel into another sample vessel. At least one discharge line discharges the sample from the dispensing unit to a transport line and a line that is perpendicular to the discharge line. A reverse direction transport line transports the sample in a direction reverse to a direction in which the sample loaded in the system is transported to the dispensing unit. The sample that is processed by the dispensing unit is transported to a storage unit located on the upstream side of the system, through the reverse direction transport line.Type: GrantFiled: September 9, 2010Date of Patent: March 22, 2016Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Shigeru Yano
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Patent number: 9211543Abstract: A test tube holder holds various types of test tubes substantially perpendicular, and is structured to be durable against extraction and insertion of the test tubes. The test tube holder includes a housing part having a hollow portion, a holding part positioned on an upper side of the housing part and having an opening portion, which accepts a test tube, and a housing portion, which houses the accepted test tube. An elastic part is formed inside the holding part so as to abut on the housed test tube. The test tube holder has a weight housed inside the hollow portion. The holding part and the elastic part may be integrally formed. Inside the hollow portion of the housing part, besides the weight, an individual identification tag, an electromagnetic wave absorbent, and a support member for a tapered test tube can be housed in accordance with usage.Type: GrantFiled: December 14, 2012Date of Patent: December 15, 2015Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Kuniaki Onizawa
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Patent number: 8956568Abstract: A sample transfer mechanism of the present invention is characterized broadly by a sample gripping method in which a downward part of a sample vessel is gripped and a cover that achieves an effect as a guide such that gripping arms that grip the sample vessel avoid contact with other objects and bypass surrounding objects, particularly, the sample vessels in approaching and retracting motions. To enhance the effect as the guide and to ensure that the sample vessels can be mounted with a high degree of integration, the shape of the cover and disposition of the sample transfer mechanism are characterized in a number of manners. Thus, a sample transfer mechanism that can perform a transfer process safely with high throughput even under conditions in which a variety of types of sample vessels is mixed together and the sample vessels are mounted with a high degree of integration is provided.Type: GrantFiled: August 31, 2011Date of Patent: February 17, 2015Assignee: Hitachi High-Technologies CorporationInventors: Akihiro Ohiso, Yoshiteru Hirama, Tatsuya Fukugaki, Tetsuya Isobe, Hiroaki Sakai
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Publication number: 20140301916Abstract: A test tube holder holds various types of test tubes substantially perpendicular, and is structured to be durable against extraction and insertion of the test tubes. The test tube holder includes a housing part having a hollow portion, a holding part positioned on an upper side of the housing part and having an opening portion, which accepts a test tube, and a housing portion, which houses the accepted test tube. An elastic part is formed inside the holding part so as to abut on the housed test tube. The test tube holder has a weight housed inside the hollow portion. The holding part and the elastic part may be integrally formed. Inside the hollow portion of the housing part, besides the weight, an individual identification tag, an electromagnetic wave absorbent, and a support member for a tapered test tube can be housed in accordance with usage.Type: ApplicationFiled: December 14, 2012Publication date: October 9, 2014Inventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Kuniaki Onizawa
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Patent number: 8833186Abstract: Conventional conveying lines have required building according to the particular shapes of test tube racks and test tube holders. For this reason, at least two types of dedicated lines, one for test tube racks and one for test tube holders, have been needed in one system, so there has been a tendency for systems to be complex in structure and disadvantageous in cost. To solve these problems, this invention provides a sample conveying system designed so that test tube racks and test tube holders can move on the same line, and high in both cost-effectiveness and reliability.Type: GrantFiled: September 8, 2010Date of Patent: September 16, 2014Assignee: Hitachi High-Technologies CorporationInventors: Tetsuya Isobe, Hiroshi Ohga, Masaaki Hanawa, Tatsuya Fukugaki
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Publication number: 20130149079Abstract: A sample transfer mechanism of the present invention is characterized broadly by a sample gripping method in which a downward part of a sample vessel is gripped and a cover that achieves an effect as a guide such that gripping arms that grip the sample vessel avoid contact with other objects and bypass surrounding objects, particularly, the sample vessels in approaching and retracting motions. To enhance the effect as the guide and to ensure that the sample vessels can be mounted with a high degree of integration, the shape of the cover and disposition of the sample transfer mechanism are characterized in a number of manners. Thus, a sample transfer mechanism that can perform a transfer process safely with high throughput even under conditions in which a variety of types of sample vessels is mixed together and the sample vessels are mounted with a high degree of integration is provided.Type: ApplicationFiled: August 31, 2011Publication date: June 13, 2013Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Akihiro Ohiso, Yoshiteru Hirama, Tatsuya Fukugaki, Tetsuya Isobe, Hiroaki Sakai
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Publication number: 20120266698Abstract: Conventional conveying lines have required building according to the particular shapes of test tube racks and test tube holders. For this reason, at least two types of dedicated lines, one for test tube racks and one for test tube holders, have been needed in one system, so there has been a tendency for systems to be complex in structure and disadvantageous in cost. To solve these problems, this invention provides a sample conveying system designed so that test tube racks and test tube holders can move on the same line, and high in both cost-effectiveness and reliability.Type: ApplicationFiled: September 8, 2010Publication date: October 25, 2012Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Tetsuya Isobe, Hiroshi Ohga, Masaaki Hanawa, Tatsuya Fukugaki
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Publication number: 20120174687Abstract: After being dispensed, a sample that needs to be quickly measured passes through another unit and is transported to an automatic analyzer. A plurality of units are provided for functions of processing including a dispensing unit that dispenses the sample stored in a sample vessel into another sample vessel. At least one discharge line discharges the sample from the dispensing unit to a transport line and a line that is perpendicular to the discharge line. A reverse direction transport line transports the sample in a direction reverse to a direction in which the sample loaded in the system is transported to the dispensing unit. The sample that is processed by the dispensing unit is transported to a storage unit located on the upstream side of the system, through the reverse direction transport line.Type: ApplicationFiled: September 9, 2010Publication date: July 12, 2012Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Hiroshi Ohga, Tatsuya Fukugaki, Tetsuya Isobe, Shigeru Yano
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Publication number: 20120129673Abstract: The weight difference is limited between buckets (17) mounted at respective symmetrical positions with respect to a centrifugal separation rotational center and examination of samples is continuously performed in the order in which they are received. In particular, when a sample (21) is carried in a centrifugal buffer line (11), its weight is measured by weight measuring means (31). It is assumed that the names of two adaptors (22) placed at respective symmetrical positions with respect to the centrifugal separation rotational center are defined as an adaptor A and an adaptor B. A first sample is put on the adaptor A and a second sample is put on the adaptor B. Then, a third sample and subsequent ones are each put on the adaptor (22) lighter than the other adaptor after the total weights of samples put on the adaptors are computation-compared with each other.Type: ApplicationFiled: July 28, 2010Publication date: May 24, 2012Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Tatsuya Fukugaki, Hiroshi Oga, Shigemi Oba, Tetsuya Isobe, Kuniaki Onizawa
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Patent number: D653351Type: GrantFiled: January 31, 2011Date of Patent: January 31, 2012Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
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Patent number: D653766Type: GrantFiled: January 31, 2011Date of Patent: February 7, 2012Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
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Patent number: D655422Type: GrantFiled: January 31, 2011Date of Patent: March 6, 2012Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
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Patent number: D655822Type: GrantFiled: January 31, 2011Date of Patent: March 13, 2012Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
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Patent number: D655823Type: GrantFiled: January 31, 2011Date of Patent: March 13, 2012Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda
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Patent number: D658776Type: GrantFiled: January 31, 2011Date of Patent: May 1, 2012Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Yoko Sato, Akira Omachi, Tetsuya Isobe, Kazuhiro Noda