Abstract: A positioning signal from a satellite positioning system is received at a mobile station, correction information from a reference station is used, a pseudo distance observation formula using a code and a phase distance observation formula using a carrier wave are used to perform positioning using single frequency at the mobile station, and these observation formulas are expressed by a satellite clock error, clock errors at the reference station and the mobile station, a ionospheric delay and a tropospheric delay, and a code bias and a phase bias of single frequency at the reference station, the mobile station and a satellite.

Abstract: A positioning signal from a satellite positioning system is received at a mobile station, correction information from a reference station is used, a pseudo distance observation formula using a code and a phase distance observation formula using a carrier wave are used to perform positioning using single frequency at the mobile station, and these observation formulas are expressed by a satellite clock error, clock errors at the reference station and the mobile station, a ionospheric delay and a tropospheric delay, and a code bias and a phase bias of single frequency at the reference station, the mobile station and a satellite.

Abstract: An embodiment of a method for testing an integrated circuit comprises a first step for determining at least one of a group selected from whether or not the chuck top receiving the integrated circuit exists near a probe card which transmits and receives electrical signals to and from the integrated circuit, whether or not the integrated circuit is under testing, and whether or not the probe card has a given temperature, and a second step for adjusting power for heating to be supplied to a heating element provided in the probe card according to the determination result in the first step.

Abstract: An embodiment of a method for testing an integrated circuit comprises a first step for determining at least one of a group selected from whether or not the chuck top receiving the integrated circuit exists near a probe card which transmits and receives electrical signals to and from the integrated circuit, whether or not the integrated circuit is under testing, and whether or not the probe card has a given temperature, and a second step for adjusting power for heating to be supplied to a heating element provided in the probe card according to the determination result in the first step.

Abstract: A probe for electrical test provided with positioning marks parallel to a plane where tips are provided and at a height position lower than the plane on a plane directed in the same direction as the plane, the positioning marks are in a predetermined positional relation to said tips. The positioning marks contain information indicating an existing direction of the tips when the positioning marks are observed from the projecting direction of the tips.

Abstract: A probe for electrical test provided with positioning marks parallel to a plane where tips are provided and at a height position lower than the plane on a plane directed in the same direction as the plane, the positioning marks are in a predetermined positional relation to said tips. The positioning marks contain information indicating an existing direction of the tips when the positioning marks are observed from the projecting direction of the tips.

Abstract: The present invention provides a cleaning apparatus capable of removing foreign matters attached to a tip of a probe effectively without impairing the durability of the probe. The cleaning apparatus for the probe comprises a base plate having a rough surface and a surface layer formed to conform to and cover the rough surface for the purpose of providing a polishing surface for the probe and having lower hardness than hardness of the probe tip of the probe.

Abstract: A microbial pesticide containing a living Erwinia carotovora subsp. carotovora, particularly, the Erwinia cartovora subsp. carotovora CGE234M403 strain, from which the pathogenicity of soft rot is deleted by mutagenesis and which is immobilized by mixing with a saccharide such as saccharose, glucose, fructose or sorbitol or beef extract and drying or freeze-drying the mixture under reduced pressure, as an active ingredient is applied to soil or plants, which are liable to suffer from soft rot, bacterial seedling blight of rice and black rot, in the form of a suspension, granules or powder to control the diseases.