Abstract: An imaging apparatus is disclosed. The image apparatus has: a camera body; a viewfinder unit including a frame; a revolving mechanism for revolving the frame; a frictional mechanism including a detachable plate and giving frictional resistance to the frame and maintaining rotation of the frame; and a lock mechanism for locking and unlocking rotation of the frame. The lock mechanism includes a cylindrical member and a manipulating member for locking. When the manipulating member is rotated in one direction, the manipulating member moves the cylindrical member toward the detachable plate. The part of the frame around a pivot-receiving hole is held between the front end of a barrel and the detachable plate. When rotated in the other direction, the manipulating member permits the cylindrical member to move away from the detachable plate.

Abstract: An imaging apparatus is disclosed. The image apparatus has: a camera body; a viewfinder unit including a frame; a revolving mechanism for revolving the frame; a frictional mechanism including a detachable plate and giving frictional resistance to the frame and maintaining rotation of the frame; and a lock mechanism for locking and unlocking rotation of the frame. The lock mechanism includes a cylindrical member and a manipulating member for locking. When the manipulating member is rotated in one direction, the manipulating member moves the cylindrical member toward the detachable plate. The part of the frame around a pivot-receiving hole is held between the front end of a barrel and the detachable plate. When rotated in the other direction, the manipulating member permits the cylindrical member to move away from the detachable plate.

Abstract: An autohandler for continuously processing devices for a shorter total processing time, for every device. The autohandler comprises: a loader (11) in which a tray (2) including devices which have not been tested is loaded; a sending shuttle (12) for transferring the tray to a test preparative position (P1); a test stage (20) for holding the tray on the sending shuttle waiting at the test preparative position, transferring the devices kept included in the tray to a test section in order, and transferring the tray to a receiving preparative position (P2); a receiving shuttle (13) for receiving the tray from the test stage at the receiving preparative position, and transferring the tray to a receiving buffer (P3); and a sorting section for sorting the devices in the tray on the receiving shuttle, on the basis of results of the test carried out by the test section.

Abstract: A flat type IC conveyor capable of conveying flat type ICs while stabilizing the posture of the ICs. A plurality of recess portions accommodating therein flat type ICs are formed lengthwise and widthwise on a flat type IC conveyor. Through holes are respectively defined in the bottom surfaces of the recess portions in a manner of avoiding leads of the ICs. Positioning pins are provided upright on the IC conveyor. A cover includes a plurality of convex portions which are positioned corresponding to the recess portions and direct to project toward package portions of the ICs to be accommodated in the recess portions. The cover also includes holes into which the positioning pins are inserted. When the cover is mounted on the conveyor, the convex portions can prevent the inclination of the ICs in the recess portions.

Abstract: A handling system which carries a carrier carrying a plurality of IC devices, subjects the IC devices to testing, sorts the tested IC devices and stores the tested IC devices, said handling system comprises test units for electrically connecting IC devices to an IC socket for transmitting electrical signals provided by the IC devices to an IC tester; a loader/unloader unit for transferring IC devices to be tested from a container to a carrier, sorting tested IC devices and selectively transferring the tested IC devices from the carrier to containers; and carrier transfer units combined with the test units, respectively, to transfer the carrier from the loader/unloader unit to the corresponding test units and from the corresponding test units to the loader/unloader unit. The number of the test units to be used in combination with the loader/unloader unit being varied according to test time required by the IC tester for testing the IC devices contained in the carrier.