Patents by Inventor Tetuji Miwa

Tetuji Miwa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Light wavelength selection device and method using diffraction grating with peak detection
    Patent number: 5420416
    Abstract: An input light beam is applied to a diffraction element. The diffraction element is moved relative to a path of the input light beam while the input light beam is diffracted by the diffraction element and is thereby made into a diffracted light beam traveling from the diffraction element. A portion of the diffracted light beam is detected, and an intensity of the received diffracted light beam is also detected. In addition, a peak of the detected intensity of the received diffracted light beam is detected while the diffraction element is moved relative to the path of the input light beam. A position of the diffraction element is detected at which the detected peak of the detected intensity occurs. The position of the diffraction element is controlled on the basis of the detected position at which the detected peak of the detected intensity occurs.
    Type: Grant
    Filed: December 2, 1993
    Date of Patent: May 30, 1995
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Masanori Iida, Hiroyuki Asakura, Tetuji Miwa