Patents by Inventor Tetuya Shinden

Tetuya Shinden has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5185523
    Abstract: A mass spectrometer for analyzing ultra trace element using plasma ion source comprising, a plasma generating means for ionizing sampling gas by generating plasma, a vaccum chamber for taking in ions of the sampling gas from a hole of the vacuum chamber, an ion lens and a mass analyzing portion, and an ion detector for detecting the ions which are passed through the ion lens and the mass analyzing portion, wherein further comprising, a moving mechanism for moving said plasma generating means according to a vacuum degree measured in the vacuum chamber so as to make the sensitivity of the mass spectrometer higher.
    Type: Grant
    Filed: March 10, 1992
    Date of Patent: February 9, 1993
    Assignees: Hitachi, Ltd., Hitachi Instrument Engineering Co., Ltd.
    Inventors: Masatoshi Kitagawa, Yukio Okamoto, Takayuki Ono, Tetuya Shinden
  • Patent number: 4429230
    Abstract: Fluorescent dye is added to a sample including lymphatic cells stimulated by antic bodies to measure fluorescence polarization. The fluorescence polarization varies with time. The measurement is stopped after a predetermined measurement time, and the lymphatic cells are separated from the sample by filtering. In order to determine the fluorescence polarization in a filtering process, approximate equations of the reaction are determined based on the fluorescence polarization measured during the reaction process. Based on the approximate equations, the fluorescence polarization in the filtering process is calculated. The reaction process is approximated by both an approximate linear line and an approximate curve. A reaction data at a predetermined future time is calculated based on the two approximate functions so that a reliability of the resulting data is improved.
    Type: Grant
    Filed: December 22, 1981
    Date of Patent: January 31, 1984
    Assignee: Hitachi, Ltd.
    Inventors: Tadashi Honkawa, Fujiya Takahata, Koichi Yagai, Yoshio Maeda, Tetuya Shinden