Patents by Inventor Teunis Both

Teunis Both has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11415550
    Abstract: The invention relates to a sensor for measuring a fluid parameter. The sensor comprises a sensing part for supplying a measurement data signal and a processing part releasably connected to the sensing part. The processing part comprises an identification recognition means capable of recognizing a presence of an identification means in the sensing part. Accordingly in the sensor a particular sensing part used may be recognized so that full functionality can be maintained when exchanging a recognized sensing part and more limited functionality is available when the sensing part is not recognized.
    Type: Grant
    Filed: March 19, 2018
    Date of Patent: August 16, 2022
    Assignee: YOKOGAWA PROCESS ANALYZERS EUROPE B.V.
    Inventors: Teunis Both, Ralph Richard de Leede
  • Publication number: 20200018725
    Abstract: The invention relates to a sensor for measuring a fluid parameter. The sensor comprises a sensing part for supplying a measurement data signal and a processing part releasably connected to the sensing part. The processing part comprises an identification recognition means capable of recognizing a presence of an identification means in the sensing part. Accordingly in the sensor a particular sensing part used may be recognized so that full functionality can be maintained when exchanging a recognized sensing part and more limited functionality is available when the sensing part is not recognized.
    Type: Application
    Filed: March 19, 2018
    Publication date: January 16, 2020
    Applicant: Yokogawa Process Analyzers Europe B.V.
    Inventors: Teunis Both, Ralph Richard de Leede
  • Patent number: 4777444
    Abstract: A testing method and apparatus for testing the condition of electrodes and their conductors in ion sensitive measuring or controlling systems, wherein the measuring circuit is disruptive and replaced by an impedance measuring circuit containing only one electrode, so that also failures of, for example, reference electrodes, soiling and deposits, and electrolyte loss, can be determined. The arrangement has sufficient accuracy to detect faults, defects and failures as they slowly come into existence.
    Type: Grant
    Filed: September 22, 1986
    Date of Patent: October 11, 1988
    Assignee: Yokogawa Electric Corporation
    Inventors: Jozeph M. Beijk, Teunis Both