Patents by Inventor Teunis Comelis van den Dool

Teunis Comelis van den Dool has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD OF ADVANCING A PROBE TIP OF A SCANNING MICROSCOPY DEVICE TOWARDS A SAMPLE SURFACE, AND DEVICE THEREFORE
    Publication number: 20170052209
    Abstract: The invention is directed at a method of advancing a probe tip of a probe of a scanning microscopy device towards a sample surface. The scanning microscopy device comprises the probe for scanning the sample surface for mapping nanostructures on the sample surface. The probe tip of the probe is mounted on a cantilever arranged for bringing the probe tip in contact with the sample surface. The method comprises controlling, by a controller, an actuator system of the device for moving the probe to the sample surface, and receiving, by the controller, a sensor signal indicative of at least one operational parameter of the probe for providing feedback to perform said controlling.
    Type: Application
    Filed: April 28, 2015
    Publication date: February 23, 2017
    Inventors: Hamed Sadeghian Marnani, Geerten Frans Ijsbrand Kramer, Teunis Comelis van den Dool