Patents by Inventor Tevfik Umut Dincer

Tevfik Umut Dincer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220415443
    Abstract: This disclosure describes methods, non-transitory computer readable media, and systems that can train a genome-location-classification model to classify or score genomic coordinates or regions by the degree to which nucleobases can be accurately identified at such genomic coordinates or regions. For instance, the disclosed systems can determine sequencing metrics for sample nucleic-acid sequences or contextual nucleic-acid subsequences surrounding particular nucleobase calls. By leveraging ground-truth classifications for genomic coordinates, the disclosed systems can train a genome-location-classification model to relate data from one or both of the sequencing metrics and contextual nucleic-acid subsequences to confidence classifications for such genomic coordinates or regions.
    Type: Application
    Filed: June 24, 2022
    Publication date: December 29, 2022
    Inventors: Mitchell A. Bekritsky, Camilla Colombo, Dorna KashefHaghighi, Rohan Paul, Fabio Zanarello, Tevfik Umut Dincer, Nathan Harwood Johnson
  • Publication number: 20180052425
    Abstract: A method for the label-free sizing of small, nanometer-sized objects such as particles includes a hand-held, portable holographic microscope that incorporates vapor condensation of nanolenses and time-resolved lens-free imaging. The portable device is used to generate reconstructed, time-resolved, and automatically-focused phase images of the sample field-of-view. The peak phase value for each object a function of working distance (z2) and condensation time (t) is used to measure object size. The sizing accuracy has been quantified in both monodisperse and heterogeneous particle solutions, achieving an accuracy of +/?11 nm for particles that range from 40 nm up to 500 nm. For larger particles, the technique still works while the accuracy roughly scales with particle size.
    Type: Application
    Filed: January 22, 2016
    Publication date: February 22, 2018
    Applicant: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
    Inventors: Aydogan Ozcan, Euan McLeod, Tevfik Umut Dincer