Abstract: A block cipher encryption device for encrypting a data unit plaintext into blocks of ciphertexts, the data unit plaintext being assigned a tweak value and being divided into one or more plaintext blocks. The block cipher encryption device comprises: a combinatorial function unit associated with each plaintext block, the combinatorial function unit being configured to determine a tweak block value by applying a combinatorial function between a value derived from the tweak value and a function of a block index assigned to the plaintext block, a first masking unit in association with each plaintext block, the first masking unit being configured to determine a masked value by applying a data masking algorithm to the tweak block value determined by the combinatorial function unit associated with the plaintext block.

Abstract: A block cipher encryption device for encrypting a data unit plaintext into blocks of ciphertexts, the data unit plaintext being assigned a tweak value and being divided into one or more plaintext blocks. The block cipher encryption device comprises: a combinatorial function unit associated with each plaintext block, the combinatorial function unit being configured to determine a tweak block value by applying a combinatorial function between a value derived from the tweak value and a function of a block index assigned to the plaintext block, a first masking unit in association with each plaintext block, the first masking unit being configured to determine a masked value by applying a data masking algorithm to the tweak block value determined by the combinatorial function unit associated with the plaintext block.

Abstract: Devices, methods, and computer program products for detecting Points Of Failures in an integrated circuit (IC) are provided. The integrated circuit device is described by a structural description (2) comprising a plurality of elements, the elements representing cells and wires interconnecting the cells, the structural description further comprising portions representing a set of sensitive functional blocks (16), each sensitive functional block comprising one or more inputs, at least one sensitive output, and a set of elements interconnected such that the value of the sensitive output is a Boolean function of the input values of the sensitive functional block.

Abstract: Devices, methods, and computer program products for detecting Points Of Failures in an integrated circuit (IC) are provided. The integrated circuit device is described by a structural description (2) comprising a plurality of elements, the elements representing cells and wires interconnecting the cells, the structural description further comprising portions representing a set of sensitive functional blocks (16), each sensitive functional block comprising one or more inputs, at least one sensitive output, and a set of elements interconnected such that the value of the sensitive output is a Boolean function of the input values of the sensitive functional block.