Patents by Inventor Thad OMURA

Thad OMURA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200019346
    Abstract: The present disclosure relates to the field of solid-state data storage, and particularly to improving the speed performance and reducing the cost of solid-state data storage devices. A host-managed data storage system according to embodiments includes a set of storage devices, each storage device including a write buffer and memory; and a host coupled to the set of storage devices, the host including: a storage device management module for managing data storage functions for each storage device; memory including: a front-end write buffer; a first mapping table for data stored in the front-end write buffer; and a second mapping table for data stored in the memory of each storage device.
    Type: Application
    Filed: July 12, 2019
    Publication date: January 16, 2020
    Inventors: Qi Wu, Wentao Wu, Thad Omura, Yang Liu, Tong Zhang
  • Publication number: 20160293274
    Abstract: Storage device FirmWare (FW) and manufacturing software techniques include access to FW images and communication of a manufacturing software tool. The manufacturing software tool enables download of the FW images into an I/O device and controlling a manufacturing test of the I/O device that is a storage device providing a storage capability. Execution of the downloaded FW images enables an I/O controller of the I/O device to provide the storage capability via operation with one or more selected types of flash memory devices. The selected types are selected from a plurality of flash memory types that the I/O controller is capable of operating with by executing appropriate ones of the FW images. Optionally the manufacturing test includes testing the storage capability of the I/O device. The techniques further include an SSD manufacturing self-test capability.
    Type: Application
    Filed: April 1, 2016
    Publication date: October 6, 2016
    Inventors: Karl David Schuh, Karl Huan-Yao Ko, Aloysius C. Ashley Wijeyeratanam, Steven Gaskill, Thad Omura, Sumit Puri, Jeremy Isaac Nathaniel Werner
  • Publication number: 20140059278
    Abstract: Storage device FirmWare (FW) and manufacturing software techniques include access to FW images and communication of a manufacturing software tool. The manufacturing software tool enables download of the FW images into an I/O device and controlling a manufacturing test of the I/O device that is a storage device providing a storage capability. Execution of the downloaded FW images enables an I/O controller of the I/O device to provide the storage capability via operation with one or more selected types of flash memory devices. The selected types are selected from a plurality of flash memory types that the I/O controller is capable of operating with by executing appropriate ones of the FW images. Optionally the manufacturing test includes testing the storage capability of the I/O device. The techniques further include an SSD manufacturing self-test capability.
    Type: Application
    Filed: November 12, 2012
    Publication date: February 27, 2014
    Applicant: LSI CORPORATION
    Inventors: Karl David Schuh, Karl Huan-Yao Ko, Aloysius C. Ashley Wijeyeratnam, Steven Gaskill, Thad Omura, Sumit Puri, Jeremy Isaac Nathaniel Werner
  • Publication number: 20130124932
    Abstract: A Solid-State Disk (SSD) Manufacturing Self Test (MST) capability enables an SSD manufacturer to generate and load tests onto SSDs, run the tests, and gather results. The SSDs self execute the loaded tests when powered up. The self executing is while coupled to a host that loaded the tests or while coupled to a rack unable to load the tests but enabled to provide power to the SSDs. The rack is optionally cost-reduced to enable cost-efficient parallel testing of relatively larger numbers of SSDs for production. The host writes the tests to an ‘input’ SMART log of each SSD, and each SSD writes results to a respective included ‘output’ SMART log. The commands include write drive, erase drive, SATA PHY burn-in, delay, and stress mode. The SSD MST capability is optionally used in conjunction with an SSD virtual manufacturing model.
    Type: Application
    Filed: March 30, 2012
    Publication date: May 16, 2013
    Applicant: LSI CORPORATION
    Inventors: Karl David SCHUH, Karl Huan-Yao KO, Aloysius C. Ashley WIJEYERATNAM, Steven GASKILL, Thad OMURA, Sumit PURI, Jeremy Isaac Nathaniel WERNER