Abstract: A digital readout test probe comprises: a dual in-line pin, clip-on-type connector for connection to a dual in-line pin integrated circuit; a housing containing a single digit decimal readout display; and a converter circuit whose output drives the readout and whose input is coupled with the clip-on connector by means of color coded lead wires. The display and converter circuit are energized from a separate power supply. When the connector is operatively connected with an integrated circuit, signals from selected terminal pins of the integrated circuit are supplied through the lead wires to the converter circuit. The selected terminal pins provide a binary coded decimal signal and the display shows the decimal value of the binary coded decimal signal so that the user of the probe does not have to decode the binary coded decimal signal into decimal form. The clip-type connector comprises a plurality of conductors each of which conducts a signal from a corresponding terminal pin of the integrated circuit.