Patents by Inventor Theo Rybarczyk

Theo Rybarczyk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12755371
    Abstract: A method analyzes optical quality of a glazing region using images of a reference pattern. A first reference image of a first fixed reference pattern is provided or acquired without the glazing, and a first distorted image of the first reference pattern is acquired with the glazing positioned between an optical image acquisition device and the first reference pattern. A second reference image of a reference pattern is provided or acquired without the glazing, and a second distorted image of the reference pattern is acquired with the glazing positioned between the optical image acquisition device and the reference pattern, the reference pattern being located at a distance different from the first reference pattern. Image points are generated on the reference and distorted images, first and second apparent displacement fields are calculated, and a simulated apparent displacement field is determined for a third distance different from the first and second distances.
    Type: Grant
    Filed: June 28, 2022
    Date of Patent: October 6, 2026
    Assignee: SAINT-GOBAIN SEKURIT FRANCE
    Inventors: Jean-Baptiste Laudereau, Theo Rybarczyk, Tatiana Severin-Fabiani