Abstract: The method and system of the present invention provides for a test tool consisting of a Test nano Kernel and supported test programs (exercisers) which sequentially stage validity tests for central complex electronics hardware for architecture and hardware implementation for a single processor or in a multiprocessor system. Central electronics complex hardware is a processor, memory sub-system and system bridge coupled together and may include the input/output ports. Each stage becomes increasingly complex as the hardware platform becomes more stable. The Test nano Kernel consists of approximately 500 K of software code, provides multiprocessor support and implements context and 64-bit execution, effective equal to real and shared memory service, segment register attachment, gang scheduling and CPU affinity services. The Test nano Kernel provides for a smooth transition from simulation due to its capabilities to run simulation test cases on real hardware.