Abstract: A probe assembly is described for providing temporary connection to electrical circuits under test such as integrated circuits and the like. Individual probes are formed of suitable metal and are provided with a 90.degree. bend to create a depending portion for contact with a pad of a circuit under test and to form a supported length extending along a slot formed in the surface of a probe guide. The slot in the probe guide terminates at a hole for receiving the depending portion of the probe; the probe is supported by and positioned by the probe guide within the slot and hole provided therefore; an elastomeric pad is placed over a portion of the probe in the slot and a pressure plate urges the elastomer into contact with the probe to provide biasing force to urge the probe to extend through the probe guide hole into contact with the pad of the circuit under test.

Abstract: An apparatus is provided for sinking heat from the diodes of an alternator bridge whereby the heat is transferred directly to the alternator casting. A mounting base is mounted on the alternator case in a manner to provide both thermal and electrical conductivity. A thin layer of thermally conductive, but electrically isolating, epoxy is sandwiched between a plate and a portion of the mounting base. "Negative" diodes are placed on the mounting base and "positive" diodes are placed on the plate so that electrical contact is made. Heat from the "negative" diodes is transferred through the mounting base and from the "positive" diodes through the plate and mounting base to the alternator casting, thereby reducing the thermal resistance and eliminating a need for large, "finned" heatsinks. The "negative" diodes or "positive" diodes may comprise a low voltage avalanche die, thereby providing for high energy transient suppression in the alternator.