Patents by Inventor Theodore R. Touw

Theodore R. Touw has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5808806
    Abstract: An optical device having a variable index of refraction across its surface includes a light transmissive material with a plurality of regions in the light transmissive material. Each region has an index of refraction which is different from the remainder of the material. The regions may be arranged in the surface of the material such that the density of the regions on the surface varies across the surface. Each region may be a bore, including a hole that extends through the light transmissive material. Variations in the density of the regions or bores as well as the depth and shape of the bores may be utilized to create variations of the refractive index within the light transmissive material. The regions form a refractive lens.
    Type: Grant
    Filed: June 17, 1997
    Date of Patent: September 15, 1998
    Assignee: International Business Machines Corporation
    Inventors: Glenn F. Guhman, Michael Ray, Theodore R. Touw
  • Patent number: 5585968
    Abstract: An optical device having a variable index of refraction across its surface includes a light transmissive material with a plurality of regions in the light transmissive material. Each region has an index of refraction which is different from the remainder of the material. The regions may be arranged in the surface of the material such that the density of the regions on the surface varies across the surface. Each region may be a bore, including a hole that extends through the light transmissive material. Variations in the density of the regions or bores as well as the depth and shape of the bores may be utilized to create variations of the refractive index within the light transmissive material.
    Type: Grant
    Filed: December 1, 1993
    Date of Patent: December 17, 1996
    Assignee: International Business Machines Corporation
    Inventors: Glenn F. Guhman, Michael Ray, Theodore R. Touw
  • Patent number: 3961190
    Abstract: A directionally sensitive, high contrast secondary electron detector having a novel geometrical configuration for use in scanning electron microscopes and other electron beam instruments. The aperture of the detector which is placed near the specimen is in non-parallel arrangement with the aperture which admits the primary beam. The geometry of the detector provides for tilting of the specimen with respect to the incident primary electron beam to improve sensitivity and signal-to-noise ratio in comparison with prior detectors. In the preferred embodiment, the shape of the upper grid of the detector is substantially that of a conic section, thereby preventing space-charge build-up during operation.
    Type: Grant
    Filed: March 6, 1975
    Date of Patent: June 1, 1976
    Assignee: International Business Machines Corporation
    Inventors: George V. Lukianoff, Theodore R. Touw