Abstract: An on-chip apparatus for generation of timing signals for a large scale integrated (LSI) chip or semiconductor memory array is disclosed. This apparatus may be used both during the production testing of the memory and during normal functional operation. In the testing environment it allows use of much less expensive peripheral test equipment, while also providing for much greater accuracy in determination of whether or not the memory array meets its timing specification. Use during normal functional operation (subsequent to use in the test environment) provides for a guarantee of defect free operation.

Abstract: Disclosed is a means for enhancing logic circuit performance and more particularly, for enhancing the switching speeds of a variety of logic circuits. What is involved is the insertion of a so called "snap" or enhancement transistor connected to a common node defining an output of a basic logic circuit. In one example, the emitter of this "snap" transistor is connected to an output node in the circuit, which in conventional practice would be charged during an upgoing transition by a fixed RC time constant. In accordance with the present improvement, however, the "snap" transistor, due to charge stored therein, remains conducting--although the associated logic device is turned off. This current discharges as reverse base current and the output provides what appears to be an inductive voltage spike. The effect is that a temporary source of current is available to charge the common node.