Patents by Inventor Theodore Zabel

Theodore Zabel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060220654
    Abstract: An IC device is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined, substantially constant emission rate. The emission rate may be tunable. In one aspect, a radioactive adhesive composition is provided for bonding a semiconductor device to a chip carrier. The radioactive adhesive composition is made from a cured reaction product including a resin and a filler, and may be reworkable or non-reworkable. Either the resin or the filler, individually or both together as a mix, are doped substantially uniformly with the transient-particle-emitting material, thereby putting the transient-particle-emitting in close proximity with the IC to be tested. The underfill is formulated to have a stable chemistry, and the doped particles are encapsulated, so as to contain the emissions. Accelerated transient-particle-emission testing may then be performed on the IC in situ to provide accelerated detection of soft errors.
    Type: Application
    Filed: April 4, 2005
    Publication date: October 5, 2006
    Applicant: International Business Machines Corporation
    Inventors: Theodore Zabel, Janes Jones, Jerry Ackaret, Michael Gaynes, Michael Gordon, Nancy LaBianca
  • Publication number: 20050143945
    Abstract: Issues that are addressed in accordance with at least one presently preferred embodiment of the present invention, are: improvements upon the time it takes to physically swap degraders (done previously by hand); the safety involved in doing so, since the degraders become highly radioactive; possible improved energy resolution and beam stability if the accelerator can be left running continuously; and in-situ monitoring of beam current, beam position and stability. Particularly contemplated are methods and arrangements for changing degraders automatically, not manually, and in a safe manner.
    Type: Application
    Filed: December 12, 2003
    Publication date: June 30, 2005
    Applicant: IBM Corporation
    Inventors: Carl Bohnenkamp, Ethan Cannon, Ethan Cascio, Michael Gordon, Kenneth Rodbell, Theodore Zabel