Abstract: A method for sequential equivalence checking (SEC) of two representations of an electronic design may include using a processor, automatically selecting a plurality of cutpoints in the two representations of the electronic design; using a processor, automatically executing a prove-from strategy on the plurality of cut point pairs to identify a failed cut point pair in the two electronic designs; and using the processor, automatically extending a trace corresponding to the identified failed cut point pair to identify a deeper failed cut point pair or a failed output pair in the two electronic designs.

Abstract: A method for sequential equivalence checking (SEC) of two representations of an electronic design includes selecting by a processor a plurality of cutpoints in the two representations of the electronic design, rendering the two representations of the electronic design abstracted; executing by the processor an assume-guarantee (AG) proof on the two abstracted representations of the electronic design; identifying by the processor a failed assertion indicating non-equivalence of a signal pair relating to one of the cutpoints; and performing by the processor a simulation on the two representations of the electronic design by successively inputting input stimuli of a trace corresponding to the failed assertion in a sequential order in which the input stimuli appear in the trace at inputs of the two representations of the electronic design to identify whether there is one or a plurality of additional non-equivalent signal pairs relating to other cutpoints of said plurality of cutpoints.

Abstract: The present disclosure relates to a computer-implemented method for performing a reset sequence simulation in an electronic design. The method may include receiving, using at least one processor, a sequence file including at least one reset, input and cycle value. The method may further include sampling during a first set of cycles set forth in the sequence file and detecting stability at a time point during a first set of cycles. The method may also include bypassing sampling during one or more remaining time points of the first set of cycles, sampling during a second set of cycles set forth in the sequence file and detecting stability at a time point during a second set of cycles.

Abstract: The present disclosure relates to a method for electronic design. Embodiments may include displaying, at a graphical user interface, at least a portion of a cover trace or an assertion counter-example associated with an electronic design. Embodiments may also include allowing, at the graphical user interface, a user to analyze the cover trace or the assertion counter-example during a debugging session. Embodiments may further include identifying a dead-end state during the analysis and converting one or more constraints used in the debugging session to soft constraints. Embodiments may further include identifying at least one trace, based upon, at least in part, the soft constraints and displaying at least one unsatisfied constraint associated with the identified trace at the graphical user interface.

Abstract: The present disclosure relates to a method for electronic design. Embodiments may include receiving, using a processor, an electronic design and performing formal verification upon at least a portion of the electronic design for a specific problem statement. Embodiments may further include generating a plurality of traces associated with the formal verification satisfying the specific problem statement and displaying, at a graphical user interface, an option to select at least one of the plurality of traces for display at the graphical user interface while the formal verification is performed.

Abstract: Disclosed are techniques for implementing trace warping for electronic designs. These techniques identify a portion of an electronic design including a set of signals of interest corresponding to a plurality of simulation combinations over a range of clock cycles in a trace display. A pair of matching simulation combinations is identified from one or more pairs of matching simulation combinations for the set of signals of interest; and a first clock cycle and a second clock cycle corresponding to the pair of matching simulation combinations are identified in the range of clock cycles. A plurality of clock cycles between the first clock cycle and the second clock cycle can be compressed in the trace display.