Patents by Inventor Thiang Nan Guan

Thiang Nan Guan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test board and process of testing wide word memory parts
    Patent number: 5796246
    Abstract: Wide word memory parts (608) are tested in a design for test "DFT" mode at elevated temperatures. The parts are mounted on test boards (600) and only the set of data I/O leads 0-3 active in the "DFT" mode, which is less than the total number of data I/O leads 0-15, connect to substrate terminals (604) that connect to tester receivers. This provides for using existing test equipment with only a change in the test boards (600) while obtaining a higher efficiency in testing a larger number of memory parts than if all the data I/O leads were connected to the receivers.
    Type: Grant
    Filed: May 29, 1996
    Date of Patent: August 18, 1998
    Assignee: Texas Instruments Incorporated
    Inventors: Looi Choon Poh, Goh Meng Kiang, Chen Teck Liong, Thiang Nan Guan, Abu Bakar