Patents by Inventor Thierry AUTHIE

Thierry AUTHIE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for optimally adjusting give error bounds or for optimally computing the variances of residuals of IGP points of an ionospheric grid for correcting an SBAS system and SBAS system for implementing said method
    Patent number: 10859707
    Abstract: A method for optimally fitting GIVE ionospheric correction error bounds and/or a method for computing variances of residuals of IGP points of an ionospheric grid for correcting an SBAS system each comprise a step of inverse interpolation implemented on a set of observation pierce points IPPi. In the method for optimally fitting the GIVEs, the step of inverse interpolation scatters for each observation pierce point IPPi concerned a variance increment ?UIVEi2 over the IGP points of the mesh cell of the IPPi by using a least squares scheme. In the computation of the variances of residuals, the step of inverse interpolation scatters for each observation pierce point IPPi concerned a residual Res2 over the IGP points of the mesh cell of the IPPi by using a least squares scheme.
    Type: Grant
    Filed: December 6, 2017
    Date of Patent: December 8, 2020
    Assignee: THALES
    Inventors: Franck Haddad, Thierry Authie, Sébastien Trilles
  • METHOD FOR OPTIMALLY ADJUSTING GIVE ERROR BOUNDS OR FOR OPTIMALLY COMPUTING THE VARIANCES OF RESIDUALS OF IGP POINTS OF AN IONOSPHERIC GRID FOR CORRECTING AN SBAS SYSTEM AND SBAS SYSTEM FOR IMPLEMENTING SAID METHOD
    Publication number: 20180188377
    Abstract: A method for optimally fitting GIVE ionospheric correction error bounds and/or a method for computing variances of residuals of IGP points of an ionospheric grid for correcting an SBAS system each comprise a step of inverse interpolation implemented on a set of observation pierce points IPPi. In the method for optimally fitting the GIVEs, the step of inverse interpolation scatters for each observation pierce point IPPi concerned a variance increment ?UIVEi2 over the IGP points of the mesh cell of the said IPPi by using a least squares scheme. In the computation of the variances of residuals, the step of inverse interpolation scatters for each observation pierce point IPPi concerned a residual Resi2 over the IGP points of the mesh cell of the said IPPi by using a least squares scheme.
    Type: Application
    Filed: December 6, 2017
    Publication date: July 5, 2018
    Inventors: Franck HADDAD, Thierry AUTHIE, Sébastien TRILLES