Abstract: According to the present invention there is provided a component handling assembly which comprises, a transport system which comprises a track, and a plurality of shuttles, wherein each of said shuttles can be driven individually and independently of one another along the track; and wherein each of said shuttles comprise a pick-up-head which can hold a component; a plurality of stations located proximate to the track, said plurality of stations comprising, a picking station at which the pickup head on a shuttle can pick components from a tray located in said picking station; at least one vision inspection station, which comprises one or more cameras, at which a component which has been picked from the picking station and transported to the vision inspection station can be inspected; and at least one of, a placing station at which the pickup head on a shuttle can place a component onto a tray, and/or, a tape station at which the pickup head on a shuttle can place a component into a pocket of a tape.

Abstract: According to the present invention there is provided a method of inspecting a component (10), using an assembly comprising a camera (3) with a fixed position, and a moveable stage (5), wherein the moveable stage is configured such that it can rotate about a rotation axis (7), and, can move linearly along two linear axes (9a, 9b) wherein said two linear axes are perpendicular to one another and wherein both of said two linear axes are each perpendicular to the rotation axis, the method comprising the steps of, (a) providing a first component into a predefined orientation on the stage, such that a first side of the component is facing a camera; (b) moving the stage linearly along one or more of said two linear axes so as to bring the first side of the first component into focus of the camera; (c) capturing an image of the first side of the first component after it has been brought into focus of the camera.

Abstract: An assembly for testing performance of a component includes a rotatable turret having component handling heads each of which can hold a component and a rotatable head assembly that includes a rotatable head having one or more nests. Each nest has an electrical contact and can receive a component that electrically connects to the nest's electrical contact. Each nest can hold a component that remains electrically connected to the electrical contact, as the head rotates. The rotatable head is adjacent to the turret to pass a component directly from a component handling head on the turret to a nest on the head. A processor is in electrical communication with the electrical contact(s) of the nests such that the processor can send command signals to a component held in a nest and receive response signals from the component. The processor determines the performance of the component from the response signals.

Abstract: An assembly for testing performance of a component includes a rotatable turret having component handling heads each of which can hold a component and a rotatable head assembly that includes a rotatable head having one or more nests. Each nest has an electrical contact and can receive a component that electrically connects to the nest's electrical contact. Each nest can hold a component that remains electrically connected to the electrical contact, as the head rotates. The rotatable head is adjacent to the turret to pass a component directly from a component handling head on the turret to a nest on the head. A processor is in electrical communication with the electrical contact(s) of the nests such that the processor can send command signals to a component held in a nest and receive response signals from the component. The processor determines the performance of the component from the response signals.